IEICE Technical Committee Submission System
Download Link
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

PDF Download Link
Presentation 2005-09-21 10:00
Recognition Method of Minute Defect Based on Comparison to Statistical Pattern and Outlier Detection on Feature Space
Kaoru Sakai, Shunji Maeda (Hitachi)
PDF Download Link Please login to the IEICE Technical Committee Online System (in Japanese).

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan