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| Presentation | 2010-02-15 14:10 On Calculation of Delay Test Quality for Test Cubes and X-filling Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech./JTS) |
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| PDF Download Link |  DC2009-73 |
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