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| Presentation | 2012-06-22 16:35 Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test Yousuke Miyake, Takuma Sasakawa, Yasuo Sato, Seiji Kajihara (Kyutech), Yukiya Miura (TMU) |
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| PDF Download Link |  DC2012-16 |
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