IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation
[Poster Presentation] Optical E-field probe characterization in a TEM cell
Takehiro Morioka (AIST), Yoshikazu Toba, Jun Ichijo (SEIKOH GIKEN), Satoru Kurokawa (AIST)
Abstract (in Japanese) (See Japanese page) 
(in English) A well-defined E-field is necessary for the characterization of the E-field probes. A transverse electromagnetic (TEM) cell is a well-known instrument to generate the standard E-field. However, the field distribution inside the cell is degraded by the higher-order modes and the upper usable frequency is limited based on the cross-sectional dimensions of the cell. A straightforward approach to extend the frequency range is to use a smaller cell and the optical E-field probe is a suitable choice for the installation into the space inside such a cell. Characterization of the optical E-field transfer probe is discussed in the present paper. The calibration factor is defined for the system characterization and sources that affect the results are carefully investigated.
Keyword (in Japanese) (See Japanese page) 
(in English) Standard E-field / TEM cell / Optical E-field probe / calibration factor / / / /  
Reference Info. IEICE Tech. Rep.
Paper #  
Date of Issue  
ISSN  
Download PDF

Conference Information
Committee PEM  
Conference Date 2015-11-27 - 2015-11-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Doshisha Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) First PEM International Workshop in Kyoto 
Paper Information
Registration To PEM 
Conference Code 2015-11-PEM 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Optical E-field probe characterization in a TEM cell 
Sub Title (in English)  
Keyword(1) Standard E-field  
Keyword(2) TEM cell  
Keyword(3) Optical E-field probe  
Keyword(4) calibration factor  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takehiro Morioka  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Yoshikazu Toba  
2nd Author's Affiliation SEIKOH GIKEN Co.,Ltd. (SEIKOH GIKEN)
3rd Author's Name Jun Ichijo  
3rd Author's Affiliation SEIKOH GIKEN Co.,Ltd. (SEIKOH GIKEN)
4th Author's Name Satoru Kurokawa  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time  
Presentation Time minutes 
Registration for PEM 
Paper #  
Volume (vol) vol. 
Number (no)  
Page  
#Pages  
Date of Issue  

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan