| Paper Abstract and Keywords |
| Presentation |
2004-07-21 14:30
A Study on the DFT Test in NIST SP800-22
Hisashi Yamamoto, Toshinobu Kaneko (T.U.S) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
The Discrete Fourier Transform Test is one of sixteen randomness tests in NIST SP800-22.The purpose of this test is to evaluate the input sequence on the basis of randomness in the sequence,which binarize frequency components by a threshold value.Hamano et al.pointed out that the empirical variance of the binarized sequence is decreased to approximately 50% of the theoretical value .In this paper,we claim that the decrease is due to the energy restriction of frequency components by Perseval's theorem.And the ratio of the variance depends on the threshold value. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Random Numbers / Randomness / Discrete Fourier Transform Test / Parseval's Theorem / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 104, no. 200, ISEC2004-50, pp. 61-64, July 2004. |
| Paper # |
ISEC2004-50 |
| Date of Issue |
2004-07-14 (ISEC) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
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| Conference Information |
| Committee |
ISEC IPSJ-CSEC |
| Conference Date |
2004-07-20 - 2004-07-21 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Tokushima Univ. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
ISEC |
| Conference Code |
2004-07-ISEC-JPSCSEC |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
A Study on the DFT Test in NIST SP800-22 |
| Sub Title (in English) |
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| Keyword(1) |
Random Numbers |
| Keyword(2) |
Randomness |
| Keyword(3) |
Discrete Fourier Transform Test |
| Keyword(4) |
Parseval's Theorem |
| Keyword(5) |
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| Keyword(6) |
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| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Hisashi Yamamoto |
| 1st Author's Affiliation |
Tokyo University of Science (T.U.S) |
| 2nd Author's Name |
Toshinobu Kaneko |
| 2nd Author's Affiliation |
Tokyo University of Science (T.U.S) |
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| Speaker |
Author-1 |
| Date Time |
2004-07-21 14:30:00 |
| Presentation Time |
25 minutes |
| Registration for |
ISEC |
| Paper # |
ISEC2004-50 |
| Volume (vol) |
vol.104 |
| Number (no) |
no.200 |
| Page |
pp.61-64 |
| #Pages |
4 |
| Date of Issue |
2004-07-14 (ISEC) |