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| Presentation | 2005-01-28 14:00 On Finding Don't Cares in Test Sequences for Sequential Circuits and Applications to Test Compaction and Power Reduction Yoshinobu Higami (Ehime Univ.), Seiji Kajihara (Kyushu Inst. Tech.), Shin-ya Kobayashi, Yuzo Takamatsu (Ehime Univ.) Link to ES Tech. Rep. Archives:  CPM2004-169 ICD2004-214 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | This paper presents a method for finding don't cares in test sequences hile keeping the original stuck-at fault coverage. Here two method are proposed for obtaining as many don't cares as possible, based on the method that utilizes fault simulation. Moreover as applications of test sequences including don't cares, power reduction method and test compaction method are proposed. By using the methods together, short test sequences with low power dissipation can be obtained. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Sequential circuit / Test sequence / Don't care values / Test compaction / Power reduction / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 104, no. 629, ICD2004-214, pp. 41-46, Jan. 2005. | |
| Paper # | ICD2004-214 | |
| Date of Issue | 2005-01-21 (CPM, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | Link to ES Tech. Rep. Archives: CPM2004-169 ICD2004-214 |
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| Conference Information | |
| Committee | ICD CPM |
| Conference Date | 2005-01-27 - 2005-01-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2005-01-ICD-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Finding Don't Cares in Test Sequences for Sequential Circuits and Applications to Test Compaction and Power Reduction |
| Sub Title (in English) | |
| Keyword(1) | Sequential circuit |
| Keyword(2) | Test sequence |
| Keyword(3) | Don't care values |
| Keyword(4) | Test compaction |
| Keyword(5) | Power reduction |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yoshinobu Higami |
| 1st Author's Affiliation | Ehime University (Ehime Univ.) |
| 2nd Author's Name | Seiji Kajihara |
| 2nd Author's Affiliation | Kyushu Institute of Tecnology (Kyushu Inst. Tech.) |
| 3rd Author's Name | Shin-ya Kobayashi |
| 3rd Author's Affiliation | Ehime University (Ehime Univ.) |
| 4th Author's Name | Yuzo Takamatsu |
| 4th Author's Affiliation | Ehime University (Ehime Univ.) |
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| Speaker | Author-1 |
| Date Time | 2005-01-28 14:00:00 |
| Presentation Time | 30 minutes |
| Registration for | ICD |
| Paper # | CPM2004-169, ICD2004-214 |
| Volume (vol) | vol.104 |
| Number (no) | no.627(CPM), no.629(ICD) |
| Page | pp.41-46 |
| #Pages | 6 |
| Date of Issue | 2005-01-21 (CPM, ICD) |
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