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Paper Abstract and Keywords
Presentation 2005-07-14 14:40
低消費電力アプリケーションに向けた低電圧パルス幅変調方式CMOSイメージセンサ
Keiichiro Kagawa (NAIST), Makoto Shouho (Sharp), Masahiro Nunoshita, Jun Ohta (NAIST) Link to ES Tech. Rep. Archives: ICD2005-49
Abstract (in Japanese) (See Japanese page) 
(in English) In this report, we discuss reduction of analog power supply voltage of CMOS image sensors to achieve low power dissipation for applications to mobile, medical, and network cameras. Although power supply voltages of digital circuits are lowered according to advances in fabrication technologies, those of analog circuits remain relatively high, which leads us to spoil the advantage of CMOS image sensors, operation by a single power supply. In addition, dynamic range of analog circuits is degraded by the lowered power supply voltage in exchange of reduced power dissipation. We report that a pulse-width-modulation readout scheme is effective for low voltage operation of CMOS image sensors without degradation of dynamic range. From the experimental results, dynamic range of 57dB for as low as 1.0-V operation of the pixel array block, which suggests the possibility of low-voltage single power-supply operation of CMOS image sensors.
Keyword (in Japanese) (See Japanese page) 
(in English) CMOS image sensor / low voltage operation / pulse-width-modulation readout scheme / / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 184, ICD2005-49, pp. 55-60, July 2005.
Paper # ICD2005-49 
Date of Issue 2005-07-07 (ICD) 
ISSN Print edition: ISSN 0913-5685
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee ICD  
Conference Date 2005-07-14 - 2005-07-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Toyohashi Univ. of Tech. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) LSIs for analog, digital-analog mixed signal processing, sensors, and communication, etc. 
Paper Information
Registration To ICD 
Conference Code 2005-07-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) 低消費電力アプリケーションに向けた低電圧パルス幅変調方式CMOSイメージセンサ 
Sub Title (in English)  
Keyword(1) CMOS image sensor  
Keyword(2) low voltage operation  
Keyword(3) pulse-width-modulation readout scheme  
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1st Author's Name Keiichiro Kagawa  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Makoto Shouho  
2nd Author's Affiliation Sharp Corporation (Sharp)
3rd Author's Name Masahiro Nunoshita  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Jun Ohta  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Date Time 2005-07-14 14:40:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2005-49 
Volume (vol) vol.105 
Number (no) no.184 
Page pp.55-60 
#Pages
Date of Issue 2005-07-07 (ICD) 


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