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Paper Abstract and Keywords
Presentation 2005-09-08 11:20
Diagnostic Test Compaction for Combinational and Sequential Circuits
Yoshinobu Higami (Ehime Univ.), Kewal K Saluja (Univ. of Wisconsin), Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu (Ehime Univ.) Link to ES Tech. Rep. Archives: CPM2005-89 ICD2005-99
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, it is getting important to reduce the cost of test and fault diagnosis.
Since the cost of test and fault diagnosis depends on the number of test vectors, test vectors must be compacted.
This paper presents a method for compacting diagnostic test sets or test sequences for combinational and sequential circuits.
The proposed methods reduce the number of test vectors while maintaining the original diagnostic capability.
In order to compact diagnostic test vectors, we must take care of a large number of fault pairs, which is the square number of faults.
The proposed methods introduce heuristics to reduce the number of fault pairs that are handled at one time.
The effectiveness of the proposed methods are shown by experimental results for ISCAS benchmark circuits.
Keyword (in Japanese) (See Japanese page) 
(in English) fault diagnosis / test compaction / combinational circuit / sequential circuit / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 267, ICD2005-99, pp. 25-30, Sept. 2005.
Paper # ICD2005-99 
Date of Issue 2005-09-01 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685
Copyright
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: CPM2005-89 ICD2005-99

Conference Information
Committee ICD CPM  
Conference Date 2005-09-08 - 2005-09-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2005-09-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Diagnostic Test Compaction for Combinational and Sequential Circuits 
Sub Title (in English)  
Keyword(1) fault diagnosis  
Keyword(2) test compaction  
Keyword(3) combinational circuit  
Keyword(4) sequential circuit  
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1st Author's Name Yoshinobu Higami  
1st Author's Affiliation Ehime University (Ehime Univ.)
2nd Author's Name Kewal K Saluja  
2nd Author's Affiliation University of Wisconsin (Univ. of Wisconsin)
3rd Author's Name Hiroshi Takahashi  
3rd Author's Affiliation Ehime University (Ehime Univ.)
4th Author's Name Shin-ya Kobayashi  
4th Author's Affiliation Ehime University (Ehime Univ.)
5th Author's Name Yuzo Takamatsu  
5th Author's Affiliation Ehime University (Ehime Univ.)
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Date Time 2005-09-08 11:20:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # CPM2005-89, ICD2005-99 
Volume (vol) vol.105 
Number (no) no.265(CPM), no.267(ICD) 
Page pp.25-30 
#Pages
Date of Issue 2005-09-01 (CPM, ICD) 


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