IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2005-12-20 15:45
*
Yasuhiro Hayase, Makoto Matsushita, Shinji Kusumoto, Katsuro Inoue (Osaka Univ.), Kenichi Kobayashi, Toshiaki Yoshino (Fujitsu Lab.)
Abstract (in Japanese) (See Japanese page) 
(in English) A software vendor sometimes contracts the maintenance of a software product that other software vendors gave up maintaining due to costs etc. In such case, the vendor must estimate costs of maintenance before contracting. However, due to lack of an objective measure, an expert estimates the cost on the basis of his/her experience. We will propose some metrics for estimating maintenance effort. These metrics are computed by applying change impact analysis to the source code which is available before contracting.
Keyword (in Japanese) (See Japanese page) 
(in English) Software Metric / Effort Estimation / Maintenance / Impact Analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 491, SS2005-73, pp. 61-66, Dec. 2005.
Paper # SS2005-73 
Date of Issue 2005-12-13 (SS) 
ISSN Print edition: ISSN 0913-5685
Download PDF

Conference Information
Committee SS  
Conference Date 2005-12-19 - 2005-12-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kochi Women's University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) general 
Paper Information
Registration To SS 
Conference Code 2005-12-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English)
Sub Title (in English)  
Keyword(1) Software Metric  
Keyword(2) Effort Estimation  
Keyword(3) Maintenance  
Keyword(4) Impact Analysis  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yasuhiro Hayase  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Makoto Matsushita  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Shinji Kusumoto  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name Katsuro Inoue  
4th Author's Affiliation Osaka University (Osaka Univ.)
5th Author's Name Kenichi Kobayashi  
5th Author's Affiliation Fujitsu Laboratories (Fujitsu Lab.)
6th Author's Name Toshiaki Yoshino  
6th Author's Affiliation Fujitsu Laboratories (Fujitsu Lab.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2005-12-20 15:45:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2005-73 
Volume (vol) vol.105 
Number (no) no.491 
Page pp.61-66 
#Pages
Date of Issue 2005-12-13 (SS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan