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Paper Abstract and Keywords
Presentation 2006-05-11 12:30
A Study on Test Pattern Generation for LSI Tests Using Chaotic Sequences
Atsushi Izukura, Ryusuke Tsuchida, Kunihiko Kudou, Daisaburo Yoshioka, Akio Tsuneda, Takahiro Inoue (Kumamoto Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) Linear feedback shift registers (LFSRs) are extensively used in built-in self-test (BIST) as a test pattern generator (TPG). In this paper, we use extended LFSRs (e-LFSRs) and chaotic sequences for BIST in order to investigate the relationship between statistical properties of test patterns and fault coverage, where ISCAS'85 benchmark circuits are used.
Keyword (in Japanese) (See Japanese page) 
(in English) BIST / TPG / LFSR / chaotic sequence / fault coverage / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 30, NLP2006-1, pp. 1-4, May 2006.
Paper # NLP2006-1 
Date of Issue 2006-05-04 (NLP) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee NLP  
Conference Date 2006-05-11 - 2006-05-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Kumamoto Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To NLP 
Conference Code 2006-05-NLP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on Test Pattern Generation for LSI Tests Using Chaotic Sequences 
Sub Title (in English)  
Keyword(1) BIST  
Keyword(2) TPG  
Keyword(3) LFSR  
Keyword(4) chaotic sequence  
Keyword(5) fault coverage  
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Keyword(7)  
Keyword(8)  
1st Author's Name Atsushi Izukura  
1st Author's Affiliation Kumamoto University (Kumamoto Univ.)
2nd Author's Name Ryusuke Tsuchida  
2nd Author's Affiliation Kumamoto University (Kumamoto Univ.)
3rd Author's Name Kunihiko Kudou  
3rd Author's Affiliation Kumamoto University (Kumamoto Univ.)
4th Author's Name Daisaburo Yoshioka  
4th Author's Affiliation Kumamoto University (Kumamoto Univ.)
5th Author's Name Akio Tsuneda  
5th Author's Affiliation Kumamoto University (Kumamoto Univ.)
6th Author's Name Takahiro Inoue  
6th Author's Affiliation Kumamoto University (Kumamoto Univ.)
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Speaker Author-1 
Date Time 2006-05-11 12:30:00 
Presentation Time 25 minutes 
Registration for NLP 
Paper # NLP2006-1 
Volume (vol) vol.106 
Number (no) no.30 
Page pp.1-4 
#Pages
Date of Issue 2006-05-04 (NLP) 


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