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Paper Abstract and Keywords
Presentation 2006-07-28 14:30
A 3500fps High-speed CMOS Image Sensor with 12b Column-Parallel Cyclic A/D Converter
Masanori Furuta (Shizuoka Univ.), Toru Inoue (Photoron), Yukinari Nishikawa, Shoji Kawahito (Shizuoka Univ.) Link to ES Tech. Rep. Archives: ICD2006-74
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents a high-speed, high-sensitivity 512 x 512 CMOS image sensor with column parallel cyclic 12b ADC's and a global electronic shutter. In CMOS implementations of high-speed image sensor, the electronic shutter can be implemented with a sample-and-hold function in each pixel. For correlated double sampling, two sample-and-hold capacitors are used in proposed pixel. The pixel circuit also achieves a relatively large charge-to-voltage conversion gain with in-pixel charge
A amplifier shared two-stage cyclic ADC with a built-in noise canceller is developed. For acceleration of conversion speed, the clock speed is increased and the size of sampling capacitor is reduced. The fully differential cyclic ADC achieves the highest resolution of 12b in the 3500 frames/s CMOS image sensor. A digital gain control function using 14b temporal digital code is also set in the column parallel ADC. The fabricated chip in 0.25um CMOS image sensor technology achieves the full frame rate in excess of 3500frames/s. The in-pixel charge amplifier achieves the optical sensitivity of 19.9V/lx s. The signal full scale at the pixel output is 1.8V at 3.3V supply and the noise level is measured to be 1.8mVrms. Therefore, the signal dynamic range is 60dB.
Keyword (in Japanese) (See Japanese page) 
(in English) high-speed image sensor / CMOS image sensor / cyclic A/D converter / column-parallel cyclic ADC / high-sensitivity / 12-bit ADC / /  
Reference Info. IEICE Tech. Rep., vol. 106, pp. 79-83, July 2006.
Paper #  
Date of Issue 2006-07-20 (ICD) 
ISSN Print edition: ISSN 0913-5685
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: ICD2006-74

Conference Information
Committee ICD ITE-IST  
Conference Date 2006-07-27 - 2006-07-28 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ITE-IST 
Conference Code 2006-07-ICD-ITE-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 3500fps High-speed CMOS Image Sensor with 12b Column-Parallel Cyclic A/D Converter 
Sub Title (in English)  
Keyword(1) high-speed image sensor  
Keyword(2) CMOS image sensor  
Keyword(3) cyclic A/D converter  
Keyword(4) column-parallel cyclic ADC  
Keyword(5) high-sensitivity  
Keyword(6) 12-bit ADC  
1st Author's Name Masanori Furuta  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Toru Inoue  
2nd Author's Affiliation Photoron, Inc. (Photoron)
3rd Author's Name Yukinari Nishikawa  
3rd Author's Affiliation Shizuoka University (Shizuoka Univ.)
4th Author's Name Shoji Kawahito  
4th Author's Affiliation Shizuoka University (Shizuoka Univ.)
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Speaker Author-1 
Date Time 2006-07-28 14:30:00 
Presentation Time 30 minutes 
Registration for ITE-IST 
Paper # ICD2006-74 
Volume (vol) vol.106 
Number (no) no.189 
Page pp.79-83 
Date of Issue 2006-07-20 (ICD) 

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