| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2006-09-26 10:50 Global Identification of Variability Factors and Its Application to the Statistical Worst-Case Model Generation Katsumi Eikyu, Takeshi Okagaki, Motoaki Tanizawa, Kiyoshi Ishikawa, Osamu Tsuchiya (Renesas) Link to ES Tech. Rep. Archives:  SDM2006-162 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A novel methodology is presented to generate the worst-case model including extraction of its compact model parameters. This method enables physically accurate worst-case prediction in the early stage of device development concurrently. It is found through the intensive TEG analysis and TCAD simulation that corraltions between process factors have a significant impact on the worst-case corner estimation. A new extraction method of compact model parameters based on error propagation analysis is developed to consider correlations between parameters. |
|
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | variability / worst-case model / TEG / RSM / statistical parameter extraction / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 106, no. 256, SDM2006-162, pp. 13-18, Sept. 2006. | |
| Paper # | SDM2006-162 | |
| Date of Issue | 2006-09-18 (VLD, SDM) | |
| ISSN | Print edition: ISSN 0913-5685 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | Link to ES Tech. Rep. Archives: SDM2006-162 |
|
| Conference Information | |
| Committee | SDM VLD |
| Conference Date | 2006-09-25 - 2006-09-26 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Process, Device, Circuit Simulation, etc. |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2006-09-SDM-VLD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Global Identification of Variability Factors and Its Application to the Statistical Worst-Case Model Generation |
| Sub Title (in English) | |
| Keyword(1) | variability |
| Keyword(2) | worst-case model |
| Keyword(3) | TEG |
| Keyword(4) | RSM |
| Keyword(5) | statistical parameter extraction |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Katsumi Eikyu |
| 1st Author's Affiliation | Renesas Technology Corp. (Renesas) |
| 2nd Author's Name | Takeshi Okagaki |
| 2nd Author's Affiliation | Renesas Technology Corp. (Renesas) |
| 3rd Author's Name | Motoaki Tanizawa |
| 3rd Author's Affiliation | Renesas Technology Corp. (Renesas) |
| 4th Author's Name | Kiyoshi Ishikawa |
| 4th Author's Affiliation | Renesas Technology Corp. (Renesas) |
| 5th Author's Name | Osamu Tsuchiya |
| 5th Author's Affiliation | Renesas Technology Corp. (Renesas) |
| 6th Author's Name | |
| 6th Author's Affiliation | () |
| 7th Author's Name | |
| 7th Author's Affiliation | () |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2006-09-26 10:50:00 |
| Presentation Time | 25 minutes |
| Registration for | SDM |
| Paper # | VLD2006-41, SDM2006-162 |
| Volume (vol) | vol.106 |
| Number (no) | no.254(VLD), no.256(SDM) |
| Page | pp.13-18 |
| #Pages | 6 |
| Date of Issue | 2006-09-18 (VLD, SDM) |
[Return to Top Page]