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Paper Abstract and Keywords
Presentation 2006-10-13 15:20
Highly reliable 1.5-μm DFB laser with SIBH structure
Tatsuya Takeshita, Takashi Tadokoro, Ryuzo Iga, Yuichi Tohmori (NTT), Mitsuo Yamamoto (NEL), Mitsuru Sugo (NTT) OCS2006-58 OPE2006-111 LQE2006-100 Link to ES Tech. Rep. Archives: OPE2006-111 LQE2006-100
Abstract (in Japanese) (See Japanese page) 
(in English) We have achieved a DFB laser with high reliability (<1000FITs) at 95°C that is capable of error-free 2.5 Gbps 80 km transmissions at -20 to 100&ordm;C. Long-term stability has been achieved by suppressing the second stage degradation.
Keyword (in Japanese) (See Japanese page) 
(in English) Semiconductor lasers / quantum well lasers / failure analysis / reliability / aging / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 284, LQE2006-100, pp. 91-95, Oct. 2006.
Paper # LQE2006-100 
Date of Issue 2006-10-05 (OCS, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OCS2006-58 OPE2006-111 LQE2006-100 Link to ES Tech. Rep. Archives: OPE2006-111 LQE2006-100

Conference Information
Committee OPE LQE OCS  
Conference Date 2006-10-12 - 2006-10-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyusyu Univ. Chikushi Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Ultra-high-speed transmission, modulation technologies, Ultra-high-speed optical / electrical devices, wideband WDM devices, detectors 
Paper Information
Registration To LQE 
Conference Code 2006-10-OPE-LQE-OCS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Highly reliable 1.5-μm DFB laser with SIBH structure 
Sub Title (in English)  
Keyword(1) Semiconductor lasers  
Keyword(2) quantum well lasers  
Keyword(3) failure analysis  
Keyword(4) reliability  
Keyword(5) aging  
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1st Author's Name Tatsuya Takeshita  
1st Author's Affiliation NTT Corporation (NTT)
2nd Author's Name Takashi Tadokoro  
2nd Author's Affiliation NTT Corporation (NTT)
3rd Author's Name Ryuzo Iga  
3rd Author's Affiliation NTT Corporation (NTT)
4th Author's Name Yuichi Tohmori  
4th Author's Affiliation NTT Corporation (NTT)
5th Author's Name Mitsuo Yamamoto  
5th Author's Affiliation NTT Electronics Corporation (NEL)
6th Author's Name Mitsuru Sugo  
6th Author's Affiliation NTT Corporation (NTT)
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Speaker Author-1 
Date Time 2006-10-13 15:20:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # OCS2006-58, OPE2006-111, LQE2006-100 
Volume (vol) vol.106 
Number (no) no.282(OCS), no.283(OPE), no.284(LQE) 
Page pp.91-95 
#Pages
Date of Issue 2006-10-05 (OCS, OPE, LQE) 


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