IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-01-19 16:40
GaN-HEMT with high breakdown voltage and high fmax for millimeter-wave application
Kozo Makiyama, Toshihiro Ohki, Kenji Imanishi, Masahito Kanamura (Fujitsu, Fujitsu Labs.), Naoki Hara (Fujitsu Labs.), Toshihide Kikkawa (Fujitsu, Fujitsu Labs.) Link to ES Tech. Rep. Archives: ED2006-239 MW2006-192
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 459, ED2006-239, pp. 213-217, Jan. 2007.
Paper # ED2006-239 
Date of Issue 2007-01-10 (ED, MW) 
ISSN Print edition: ISSN 0913-5685
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: ED2006-239 MW2006-192

Conference Information
Committee MW ED  
Conference Date 2007-01-17 - 2007-01-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ED 
Conference Code 2007-01-MW-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) GaN-HEMT with high breakdown voltage and high fmax for millimeter-wave application 
Sub Title (in English)  
Keyword(1)  
Keyword(2)  
Keyword(3)  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kozo Makiyama  
1st Author's Affiliation Fujitsu Ltd., Fujitsu Labs. Ltd. (Fujitsu, Fujitsu Labs.)
2nd Author's Name Toshihiro Ohki  
2nd Author's Affiliation Fujitsu Ltd., Fujitsu Labs. Ltd. (Fujitsu, Fujitsu Labs.)
3rd Author's Name Kenji Imanishi  
3rd Author's Affiliation Fujitsu Ltd., Fujitsu Labs. Ltd. (Fujitsu, Fujitsu Labs.)
4th Author's Name Masahito Kanamura  
4th Author's Affiliation Fujitsu Ltd., Fujitsu Labs. Ltd. (Fujitsu, Fujitsu Labs.)
5th Author's Name Naoki Hara  
5th Author's Affiliation Fujitsu Labs. Ltd. (Fujitsu Labs.)
6th Author's Name Toshihide Kikkawa  
6th Author's Affiliation Fujitsu Ltd., Fujitsu Labs. Ltd. (Fujitsu, Fujitsu Labs.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2007-01-19 16:40:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2006-239, MW2006-192 
Volume (vol) vol.106 
Number (no) no.459(ED), no.460(MW) 
Page pp.213-217 
#Pages
Date of Issue 2007-01-10 (ED, MW) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan