Paper Abstract and Keywords |
Presentation |
2008-05-14 16:00
Considering Performance and Area Overhead in DVS System Utilizing Input Variations Yuji Kunitake (Kyushu U.), Toshinori Sato (Fukuoka U.), Hiroto Yasuura (Kyushu U.) Link to ES Tech. Rep. Archives: ICD2008-34 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The deep submicron semiconductor technologies increase parameter variations and thus the processor design becomes more difficult. The increase in parameter variations requirs excessive design margin that has serious impact on performance and power consumption. In order to eliminate the excessive design margin, we are investigating canary logic. Current canary logic causes severe performance loss and area overhead. In this paper, we show solutions for these problems. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
variation / Dynamic Voltage Scaling / reliability / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, pp. 93-98, May 2008. |
Paper # |
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Date of Issue |
2008-05-06 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
Link to ES Tech. Rep. Archives: ICD2008-34 |
Conference Information |
Committee |
ICD IPSJ-ARC |
Conference Date |
2008-05-13 - 2008-05-14 |
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(See Japanese page) |
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Paper Information |
Registration To |
IPSJ-ARC |
Conference Code |
2008-05-ICD-ARC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Considering Performance and Area Overhead in DVS System Utilizing Input Variations |
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Keyword(1) |
variation |
Keyword(2) |
Dynamic Voltage Scaling |
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reliability |
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1st Author's Name |
Yuji Kunitake |
1st Author's Affiliation |
Kyushu University (Kyushu U.) |
2nd Author's Name |
Toshinori Sato |
2nd Author's Affiliation |
Fukuoka University (Fukuoka U.) |
3rd Author's Name |
Hiroto Yasuura |
3rd Author's Affiliation |
Kyushu University (Kyushu U.) |
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Speaker |
Author-1 |
Date Time |
2008-05-14 16:00:00 |
Presentation Time |
30 minutes |
Registration for |
IPSJ-ARC |
Paper # |
ICD2008-34 |
Volume (vol) |
vol.108 |
Number (no) |
no.28 |
Page |
pp.93-98 |
#Pages |
6 |
Date of Issue |
2008-05-06 (ICD) |