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Paper Abstract and Keywords
Presentation 2008-06-26 16:30
Radiation-Induced Transient-Pulses in Logic LSIs for Use in Space Applications
Takahiro Makino (SOKENDAI), Yoshimitsu Yanagawa (U. Tokyo), Daisuke Kobayashi (SOKENDAI/JAXA), Seisuke Fukuda (JAXA), Kazuyuki Hirose, Hirokazu Ikeda (SOKENDAI/JAXA), Hirobumi Saito (U. Tokyo/JAXA), Shinobu Onoda, Toshio Hirao, Takeshi Ohshima (JAEA), Daisuke Takahashi, Shigeru Ishii, Masaki Kusano, Hiroshi Ikebuchi, Yoshikatsu Kuroda (MHI) SANE2008-25
Abstract (in Japanese) (See Japanese page) 
(in English) SET pulse-widths were measured as a function of LET by using pulse capture circuits.
In addition, a scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI system.
Keyword (in Japanese) (See Japanese page) 
(in English) Soft error / Logic VLSI / Single event transient / / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 100, SANE2008-25, pp. 67-72, June 2008.
Paper # SANE2008-25 
Date of Issue 2008-06-19 (SANE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SANE  
Conference Date 2008-06-26 - 2008-06-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Tsukuba Space Center (JAXA) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Space applications symposium 
Paper Information
Registration To SANE 
Conference Code 2008-06-SANE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Radiation-Induced Transient-Pulses in Logic LSIs for Use in Space Applications 
Sub Title (in English)  
Keyword(1) Soft error  
Keyword(2) Logic VLSI  
Keyword(3) Single event transient  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takahiro Makino  
1st Author's Affiliation The Graduate University for Advanced Studies (SOKENDAI)
2nd Author's Name Yoshimitsu Yanagawa  
2nd Author's Affiliation University of Tokyo (U. Tokyo)
3rd Author's Name Daisuke Kobayashi  
3rd Author's Affiliation The Graduate University for Advanced Studies/Japan Aerospace Exploration Agency (SOKENDAI/JAXA)
4th Author's Name Seisuke Fukuda  
4th Author's Affiliation Japan Aerospace Exploration Agency (JAXA)
5th Author's Name Kazuyuki Hirose  
5th Author's Affiliation The Graduate University for Advanced Studies/Japan Aerospace Exploration Agency (SOKENDAI/JAXA)
6th Author's Name Hirokazu Ikeda  
6th Author's Affiliation The Graduate University for Advanced Studies/Japan Aerospace Exploration Agency (SOKENDAI/JAXA)
7th Author's Name Hirobumi Saito  
7th Author's Affiliation University of Tokyo/Japan Aerospace Exploration Agency (U. Tokyo/JAXA)
8th Author's Name Shinobu Onoda  
8th Author's Affiliation Japan Atomic Energy Agency (JAEA)
9th Author's Name Toshio Hirao  
9th Author's Affiliation Japan Atomic Energy Agency (JAEA)
10th Author's Name Takeshi Ohshima  
10th Author's Affiliation Japan Atomic Energy Agency (JAEA)
11th Author's Name Daisuke Takahashi  
11th Author's Affiliation Mitsubishi Heavy Industries, Ltd (MHI)
12th Author's Name Shigeru Ishii  
12th Author's Affiliation Mitsubishi Heavy Industries, Ltd (MHI)
13th Author's Name Masaki Kusano  
13th Author's Affiliation Mitsubishi Heavy Industries, Ltd (MHI)
14th Author's Name Hiroshi Ikebuchi  
14th Author's Affiliation Mitsubishi Heavy Industries, Ltd (MHI)
15th Author's Name Yoshikatsu Kuroda  
15th Author's Affiliation Mitsubishi Heavy Industries, Ltd (MHI)
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Speaker Author-1 
Date Time 2008-06-26 16:30:00 
Presentation Time 25 minutes 
Registration for SANE 
Paper # SANE2008-25 
Volume (vol) vol.108 
Number (no) no.100 
Page pp.67-72 
#Pages
Date of Issue 2008-06-19 (SANE) 


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