Paper Abstract and Keywords |
Presentation |
2008-06-26 16:30
Radiation-Induced Transient-Pulses in Logic LSIs for Use in Space Applications Takahiro Makino (SOKENDAI), Yoshimitsu Yanagawa (U. Tokyo), Daisuke Kobayashi (SOKENDAI/JAXA), Seisuke Fukuda (JAXA), Kazuyuki Hirose, Hirokazu Ikeda (SOKENDAI/JAXA), Hirobumi Saito (U. Tokyo/JAXA), Shinobu Onoda, Toshio Hirao, Takeshi Ohshima (JAEA), Daisuke Takahashi, Shigeru Ishii, Masaki Kusano, Hiroshi Ikebuchi, Yoshikatsu Kuroda (MHI) SANE2008-25 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
SET pulse-widths were measured as a function of LET by using pulse capture circuits.
In addition, a scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI system. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Soft error / Logic VLSI / Single event transient / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 100, SANE2008-25, pp. 67-72, June 2008. |
Paper # |
SANE2008-25 |
Date of Issue |
2008-06-19 (SANE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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SANE2008-25 |
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