IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2008-11-08 15:30
Statistical Mechanics of Partial Annealing -- Mexican-hat-type interaction case --
Kazuyuki Hara (Tokyo Metro. College), Tatsuya Uezu (Nara Women's Univ.), Seiji Miyoshi (Kansai Univ.), Masato Okada (Tokyo Univ.) NC2008-72
Abstract (in Japanese) (See Japanese page) 
(in English) We analyzed the equilibrium states of an Ising spin neural network model
in which both spins and interactions evolve simultaneously over time.
The interactions are Mexican-hat-type, which are used for lateral inhibition
models. The model shows a bump activity, which is the locally activated network state.
The time-dependent interactions are driven by Langevin noise and Hebbian
learning. The analysis results reveal that Hebbian learning expands the
bistable regions of the ferromagnetic and local excitation phases.
Keyword (in Japanese) (See Japanese page) 
(in English) Ising spin neural network / Partial Annealing / Replica method / Mexican-hat-type interaction / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 281, NC2008-72, pp. 79-83, Nov. 2008.
Paper # NC2008-72 
Date of Issue 2008-10-31 (NC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF NC2008-72

Conference Information
Committee NC  
Conference Date 2008-11-07 - 2008-11-08 
Place (in Japanese) (See Japanese page) 
Place (in English) Saga Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To NC 
Conference Code 2008-11-NC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Statistical Mechanics of Partial Annealing 
Sub Title (in English) Mexican-hat-type interaction case 
Keyword(1) Ising spin neural network  
Keyword(2) Partial Annealing  
Keyword(3) Replica method  
Keyword(4) Mexican-hat-type interaction  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kazuyuki Hara  
1st Author's Affiliation Tokyo Metropolitan College of Industrial Engineering (Tokyo Metro. College)
2nd Author's Name Tatsuya Uezu  
2nd Author's Affiliation Nara Women's University (Nara Women's Univ.)
3rd Author's Name Seiji Miyoshi  
3rd Author's Affiliation Kansai University (Kansai Univ.)
4th Author's Name Masato Okada  
4th Author's Affiliation The Tokyo University (Tokyo Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2008-11-08 15:30:00 
Presentation Time 25 minutes 
Registration for NC 
Paper # NC2008-72 
Volume (vol) vol.108 
Number (no) no.281 
Page pp.79-83 
#Pages
Date of Issue 2008-10-31 (NC) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan