IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2008-11-15 09:00
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism -- Basal characteristics of 3-D oscillating mechanism --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Hiroto Minegishi, Yukiharu Kobayashi, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio University) EMD2008-65 Link to ES Tech. Rep. Archives: EMD2008-65
Abstract (in Japanese) (See Japanese page) 
(in English) The authors have developed the 3-D oscillation mechanism which expanded 1-D oscillation mechanism, that is to say “hammering oscillating mechanism” and “sliding contact mechanism”, into 3-D. And the fundamental characteristics of the mechanism are obtained, such as accelerations, displacements at various frequencies, output wave forms to sinusoidal inputs, and mechanical interferences with the X, Y, and Z-directions of the stage. Experimental results suggested that the mechanism could detect more real degradation phenomenon on contacts by the influences of micro-vibration. However, it is necessary that the mechanism should be improved, for instance, in precision mechanism and in feedback control.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / 3-D oscillating mechanism / magnetostrictive actuator / micro-vibration / contact resistance / hammering oscillation mechanism / sliding contact mechanism /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 296, EMD2008-65, pp. 1-4, Nov. 2008.
Paper # EMD2008-65 
Date of Issue 2008-11-08 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2008-65 Link to ES Tech. Rep. Archives: EMD2008-65

Conference Information
Committee EMD  
Conference Date 2008-11-15 - 2008-11-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Bunka Gakuin University (Sendai) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session on Electro-Mechanical Devices 2008 
Paper Information
Registration To EMD 
Conference Code 2008-11-EMD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by 3-D oscillating mechanism 
Sub Title (in English) Basal characteristics of 3-D oscillating mechanism 
Keyword(1) electrical contact  
Keyword(2) 3-D oscillating mechanism  
Keyword(3) magnetostrictive actuator  
Keyword(4) micro-vibration  
Keyword(5) contact resistance  
Keyword(6) hammering oscillation mechanism  
Keyword(7) sliding contact mechanism  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC SYSTEM CO., LTD. (TMC System)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC SYSTEM CO., LTD. (TMC System)
3rd Author's Name Taketo Sonoda  
3rd Author's Affiliation TMC SYSTEM CO., LTD. (TMC System)
4th Author's Name Hiroto Minegishi  
4th Author's Affiliation TMC SYSTEM CO., LTD. (TMC System)
5th Author's Name Yukiharu Kobayashi  
5th Author's Affiliation TMC SYSTEM CO., LTD. (TMC System)
6th Author's Name Mitsuo Kikuchi  
6th Author's Affiliation TMC SYSTEM CO., LTD. (TMC System)
7th Author's Name Hiroaki Kubota  
7th Author's Affiliation TMC SYSTEM CO., LTD. (TMC System)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Keio University (Keio University)
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2008-11-15 09:00:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # EMD2008-65 
Volume (vol) vol.108 
Number (no) no.296 
Page pp.1-4 
#Pages
Date of Issue 2008-11-08 (EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan