Paper Abstract and Keywords |
Presentation |
2008-11-15 09:00
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism
-- Basal characteristics of 3-D oscillating mechanism -- Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Hiroto Minegishi, Yukiharu Kobayashi, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio University) EMD2008-65 Link to ES Tech. Rep. Archives: EMD2008-65 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The authors have developed the 3-D oscillation mechanism which expanded 1-D oscillation mechanism, that is to say “hammering oscillating mechanism” and “sliding contact mechanism”, into 3-D. And the fundamental characteristics of the mechanism are obtained, such as accelerations, displacements at various frequencies, output wave forms to sinusoidal inputs, and mechanical interferences with the X, Y, and Z-directions of the stage. Experimental results suggested that the mechanism could detect more real degradation phenomenon on contacts by the influences of micro-vibration. However, it is necessary that the mechanism should be improved, for instance, in precision mechanism and in feedback control. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / 3-D oscillating mechanism / magnetostrictive actuator / micro-vibration / contact resistance / hammering oscillation mechanism / sliding contact mechanism / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 296, EMD2008-65, pp. 1-4, Nov. 2008. |
Paper # |
EMD2008-65 |
Date of Issue |
2008-11-08 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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EMD2008-65 Link to ES Tech. Rep. Archives: EMD2008-65 |
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