| Paper Abstract and Keywords |
| Presentation |
2008-11-17 16:05
Insertion-Point Selection of Canary FF for Timing Error Prediction
Yuji Kunitake (Kyushu Univ.), Toshinori Sato (Fukuoka Univ.), Seiichiro Yamaguchi, Hiroto Yasuura (Kyushu Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
The deep submicron semiconductor technologies increase parameter ariations. The increase in parameter variations requires excessive design margin that has serious impact on performance and power consumption. In order to eliminate the excessive design margin, we are investigating canary logic. The canary logic requires additional circuits consisting of a Flip-Flop (FF) and a comparator. Thus, the canary logic suffers large area overhead.
In order to reduce the area overhead, this paper proposes an insertion oint selection strategy of canary FF and evaluates it. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
variation / Dynamic Voltage Scaling / reliability / critical path / worst-case design / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 108, pp. 85-89, Nov. 2008. |
| Paper # |
|
| Date of Issue |
2008-11-10 (VLD, DC) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
| Download PDF |
|
| Conference Information |
| Committee |
VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
| Conference Date |
2008-11-17 - 2008-11-19 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kitakyushu Science and Research Park |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Design Gaia 2008 ―New field of VLSI design― |
| Paper Information |
| Registration To |
IPSJ-SLDM |
| Conference Code |
2008-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Insertion-Point Selection of Canary FF for Timing Error Prediction |
| Sub Title (in English) |
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| Keyword(1) |
variation |
| Keyword(2) |
Dynamic Voltage Scaling |
| Keyword(3) |
reliability |
| Keyword(4) |
critical path |
| Keyword(5) |
worst-case design |
| Keyword(6) |
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| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Yuji Kunitake |
| 1st Author's Affiliation |
Kyushu University (Kyushu Univ.) |
| 2nd Author's Name |
Toshinori Sato |
| 2nd Author's Affiliation |
Fukuoka University (Fukuoka Univ.) |
| 3rd Author's Name |
Seiichiro Yamaguchi |
| 3rd Author's Affiliation |
Kyushu University (Kyushu Univ.) |
| 4th Author's Name |
Hiroto Yasuura |
| 4th Author's Affiliation |
Kyushu University (Kyushu Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2008-11-17 16:05:00 |
| Presentation Time |
25 minutes |
| Registration for |
IPSJ-SLDM |
| Paper # |
VLD2008-74, DC2008-42 |
| Volume (vol) |
vol.108 |
| Number (no) |
no.298(VLD), no.299(DC) |
| Page |
pp.85-89 |
| #Pages |
5 |
| Date of Issue |
2008-11-10 (VLD, DC) |