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| Presentation | 2008-11-17 13:25 Dynamically Variable Secure Scan Architecture against Scan-based Side Channel Attack on Cryptography LSIs Hiroshi Atobe, Ryuta Nara, Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki (Waseda Univ.)  VLD2008-69 DC2008-37 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan chains would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan chains to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each SDSFF to be inverted or not so as to make it more difficult to discover the internal scan architecture. We made an analysis on an AES implementation to show the effectiveness of the proposed method and discussed how our approach is resistant to scan-based side channel attack. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Scan-based attack / Secure scan architecture / Scan chain / AES / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 298, VLD2008-69, pp. 55-59, Nov. 2008. | |
| Paper # | VLD2008-69 | |
| Date of Issue | 2008-11-10 (VLD, DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2008-69 DC2008-37 |
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| Conference Information | |
| Committee | VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
| Conference Date | 2008-11-17 - 2008-11-19 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kitakyushu Science and Research Park |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2008 ―New field of VLSI design― |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2008-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Dynamically Variable Secure Scan Architecture against Scan-based Side Channel Attack on Cryptography LSIs |
| Sub Title (in English) | |
| Keyword(1) | Scan-based attack |
| Keyword(2) | Secure scan architecture |
| Keyword(3) | Scan chain |
| Keyword(4) | AES |
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| 1st Author's Name | Hiroshi Atobe |
| 1st Author's Affiliation | Waseda University (Waseda Univ.) |
| 2nd Author's Name | Ryuta Nara |
| 2nd Author's Affiliation | Waseda University (Waseda Univ.) |
| 3rd Author's Name | Youhua Shi |
| 3rd Author's Affiliation | Waseda University (Waseda Univ.) |
| 4th Author's Name | Nozomu Togawa |
| 4th Author's Affiliation | Waseda University (Waseda Univ.) |
| 5th Author's Name | Masao Yanagisawa |
| 5th Author's Affiliation | Waseda University (Waseda Univ.) |
| 6th Author's Name | Tatsuo Ohtsuki |
| 6th Author's Affiliation | Waseda University (Waseda Univ.) |
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| Speaker | Author-1 |
| Date Time | 2008-11-17 13:25:00 |
| Presentation Time | 25 minutes |
| Registration for | VLD |
| Paper # | VLD2008-69, DC2008-37 |
| Volume (vol) | vol.108 |
| Number (no) | no.298(VLD), no.299(DC) |
| Page | pp.55-59 |
| #Pages | 5 |
| Date of Issue | 2008-11-10 (VLD, DC) |
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