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Paper Abstract and Keywords
Presentation 2008-11-18 13:45
[Invited Talk] Thermal design and on-die thermal sensing in the SX supercompurters
Mikihiro Kajita, Eisuke Saneyoshi, Koichi Nose, Masayuki Mizuno (NEC Corporation) CPM2008-91 ICD2008-90 Link to ES Tech. Rep. Archives: CPM2008-91 ICD2008-90
Abstract (in Japanese) (See Japanese page) 
(in English) NEC has developed supercomputers "SX" using the leading-edge LSI technologies. In the latest microprocessors, CMOS transistors are integrated over die with high density, which may result in an enormous increase in power density. To prevent this critical increase in power consumption, we have proposed a thermal sensor based on transistor off-leakage current, that allows measurement error of less than 3.1℃ even at high temperature. In this paper, we present our thermal sensor and our thermal design using this sensor.
Keyword (in Japanese) (See Japanese page) 
(in English) supercompurter / thermal design / on-die thermal sensing / off leakage current / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 302, ICD2008-90, pp. 13-18, Nov. 2008.
Paper # ICD2008-90 
Date of Issue 2008-11-11 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2008-91 ICD2008-90 Link to ES Tech. Rep. Archives: CPM2008-91 ICD2008-90

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2008-11-17 - 2008-11-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitakyushu Science and Research Park 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2008 ―New field of VLSI design― 
Paper Information
Registration To ICD 
Conference Code 2008-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Thermal design and on-die thermal sensing in the SX supercompurters 
Sub Title (in English)  
Keyword(1) supercompurter  
Keyword(2) thermal design  
Keyword(3) on-die thermal sensing  
Keyword(4) off leakage current  
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1st Author's Name Mikihiro Kajita  
1st Author's Affiliation NEC Corporation (NEC Corporation)
2nd Author's Name Eisuke Saneyoshi  
2nd Author's Affiliation NEC Corporation (NEC Corporation)
3rd Author's Name Koichi Nose  
3rd Author's Affiliation NEC Corporation (NEC Corporation)
4th Author's Name Masayuki Mizuno  
4th Author's Affiliation NEC Corporation (NEC Corporation)
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Speaker Author-1 
Date Time 2008-11-18 13:45:00 
Presentation Time 45 minutes 
Registration for ICD 
Paper # CPM2008-91, ICD2008-90 
Volume (vol) vol.108 
Number (no) no.301(CPM), no.302(ICD) 
Page pp.13-18 
#Pages
Date of Issue 2008-11-11 (CPM, ICD) 


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