Paper Abstract and Keywords |
Presentation |
2008-11-18 10:30
[Poster Presentation]
A Test Point Insertion Method for Test Data Reduction Based on Necessary Assignment Kazuko Hiramoto, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ) VLD2008-80 DC2008-48 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this work, we discuss a method for reducing test data by test point insertion. Focusing on the fact that test points can resolve conflicts among faults that require different assignments to identical signal lines
for detection, we propose a measure of test points for the ability to resolve such fault conflict based on necessary assignments for fault detection. We also present an algorithm for inserting test points in scan design based on the proposed test point measure. The analytical results with experiments show that, there exists an optimal number of test points which minimizes the amount of test data (or the test application time). Experimental results show that our test point insertion method is effective in reducing the test data volume, not just the number of test patterns, with a few test points, and the proposed test point measure is more effective in reducing the test patterns than the mesure reported in previous works. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Test Point / test data reduction / implication / necessary assignment / fault conflict / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 299, DC2008-48, pp. 121-126, Nov. 2008. |
Paper # |
DC2008-48 |
Date of Issue |
2008-11-10 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
VLD2008-80 DC2008-48 |
Conference Information |
Committee |
VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
Conference Date |
2008-11-17 - 2008-11-19 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kitakyushu Science and Research Park |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design Gaia 2008 ―New field of VLSI design― |
Paper Information |
Registration To |
DC |
Conference Code |
2008-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Test Point Insertion Method for Test Data Reduction Based on Necessary Assignment |
Sub Title (in English) |
|
Keyword(1) |
Test Point |
Keyword(2) |
test data reduction |
Keyword(3) |
implication |
Keyword(4) |
necessary assignment |
Keyword(5) |
fault conflict |
Keyword(6) |
|
Keyword(7) |
|
Keyword(8) |
|
1st Author's Name |
Kazuko Hiramoto |
1st Author's Affiliation |
Hiroshima City University (Hiroshima City Univ) |
2nd Author's Name |
Yuki Yoshikawa |
2nd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ) |
3rd Author's Name |
Hideyuki Ichihara |
3rd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ) |
4th Author's Name |
Tomoo Inoue |
4th Author's Affiliation |
Hiroshima City University (Hiroshima City Univ) |
5th Author's Name |
|
5th Author's Affiliation |
() |
6th Author's Name |
|
6th Author's Affiliation |
() |
7th Author's Name |
|
7th Author's Affiliation |
() |
8th Author's Name |
|
8th Author's Affiliation |
() |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2008-11-18 10:30:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
VLD2008-80, DC2008-48 |
Volume (vol) |
vol.108 |
Number (no) |
no.298(VLD), no.299(DC) |
Page |
pp.121-126 |
#Pages |
6 |
Date of Issue |
2008-11-10 (VLD, DC) |
|