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Paper Abstract and Keywords
Presentation 2008-12-11 13:30
[Poster Presentation] EMC analysis of LSI -- Evaluation and simulation of on-chip and on-board power supply noise --
Kumpei Yoshikawa, Makoto Nagata (Kobe Univ.) ICD2008-109 Link to ES Tech. Rep. Archives: ICD2008-109
Abstract (in Japanese) (See Japanese page) 
(in English) We have measured power supply noise waveforms by on-chip monitors, and power supply current spectrum on the PCB by a magnetic probe respectively. Measured off-chip current spectrums are translated to the on-chip voltage variation using an equivalent circuit model, and we have confirmed consistency of the on-chip measured power supply voltage and off-chip measured power supply current. On the other hand we have made a chip-package-board integrated model. We have simulated power supply noise with this integrated model and verified the efficiency of this model.
Keyword (in Japanese) (See Japanese page) 
(in English) EMC / power supply noise / noise analysis / / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 347, ICD2008-109, pp. 43-46, Dec. 2008.
Paper # ICD2008-109 
Date of Issue 2008-12-04 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2008-109 Link to ES Tech. Rep. Archives: ICD2008-109

Conference Information
Committee ICD  
Conference Date 2008-12-11 - 2008-12-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Inst. Tech., Ohokayama Campus, Kokusa-Kouryu-Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Workshop for Graduate Student and Young Researchers 
Paper Information
Registration To ICD 
Conference Code 2008-12-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) EMC analysis of LSI 
Sub Title (in English) Evaluation and simulation of on-chip and on-board power supply noise 
Keyword(1) EMC  
Keyword(2) power supply noise  
Keyword(3) noise analysis  
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1st Author's Name Kumpei Yoshikawa  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Makoto Nagata  
2nd Author's Affiliation Kobe University (Kobe Univ.)
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Speaker Author-1 
Date Time 2008-12-11 13:30:00 
Presentation Time 165 minutes 
Registration for ICD 
Paper # ICD2008-109 
Volume (vol) vol.108 
Number (no) no.347 
Page pp.43-46 
#Pages
Date of Issue 2008-12-04 (ICD) 


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