Paper Abstract and Keywords |
Presentation |
2008-12-11 13:30
[Poster Presentation]
EMC analysis of LSI
-- Evaluation and simulation of on-chip and on-board power supply noise -- Kumpei Yoshikawa, Makoto Nagata (Kobe Univ.) ICD2008-109 Link to ES Tech. Rep. Archives: ICD2008-109 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have measured power supply noise waveforms by on-chip monitors, and power supply current spectrum on the PCB by a magnetic probe respectively. Measured off-chip current spectrums are translated to the on-chip voltage variation using an equivalent circuit model, and we have confirmed consistency of the on-chip measured power supply voltage and off-chip measured power supply current. On the other hand we have made a chip-package-board integrated model. We have simulated power supply noise with this integrated model and verified the efficiency of this model. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
EMC / power supply noise / noise analysis / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 347, ICD2008-109, pp. 43-46, Dec. 2008. |
Paper # |
ICD2008-109 |
Date of Issue |
2008-12-04 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2008-109 Link to ES Tech. Rep. Archives: ICD2008-109 |
Conference Information |
Committee |
ICD |
Conference Date |
2008-12-11 - 2008-12-12 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tokyo Inst. Tech., Ohokayama Campus, Kokusa-Kouryu-Kaikan |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Workshop for Graduate Student and Young Researchers |
Paper Information |
Registration To |
ICD |
Conference Code |
2008-12-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
EMC analysis of LSI |
Sub Title (in English) |
Evaluation and simulation of on-chip and on-board power supply noise |
Keyword(1) |
EMC |
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power supply noise |
Keyword(3) |
noise analysis |
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1st Author's Name |
Kumpei Yoshikawa |
1st Author's Affiliation |
Kobe University (Kobe Univ.) |
2nd Author's Name |
Makoto Nagata |
2nd Author's Affiliation |
Kobe University (Kobe Univ.) |
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Speaker |
Author-1 |
Date Time |
2008-12-11 13:30:00 |
Presentation Time |
165 minutes |
Registration for |
ICD |
Paper # |
ICD2008-109 |
Volume (vol) |
vol.108 |
Number (no) |
no.347 |
Page |
pp.43-46 |
#Pages |
4 |
Date of Issue |
2008-12-04 (ICD) |