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| Presentation | 2009-01-16 10:00 Three Dimensional Numerical Analysis of Optical Near Field in Bow-tie Type Nano-Aperture of a Metallic Layer Hiroki Ito (Kansai Univ.), Yiwei He (Osaka Electro-Communication Univ.), Toshitaka Kojima (Kansai Univ.)  MR2008-59 Link to ES Tech. Rep. Archives: MR2008-59 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Recently, a density growth is demanded in optical storage technologies. But, It is said that the upper limit of recording density by the current optical recording system is several tens of gigabits per inch square due to the optical diffraction limit even in the case of using a short wavelength. Then, as a technology that enables us to break down the optical diffraction limit, the optical near field technology has gotten a lot of attention. In this paper, we try to perform three-dimensional numerical analysis of an optical near field distributions in a metallic bow-tie type nano-aperture by using the FDTD method. In the present analysis, the FDTD method combined with the motion equation of electron is applied to a metallic medium whose permittivity can become negative at the optical wavelength range. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Optical near field / Optical recording / Nano-aperture / Metal / FDTD method / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, Jan. 2009. | |
| Paper # | ||
| Date of Issue | 2009-01-08 (MR) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MR2008-59 Link to ES Tech. Rep. Archives: MR2008-59 |
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| Conference Information | |
| Committee | ITE-MMS ITE-CE MRIS |
| Conference Date | 2009-01-15 - 2009-01-16 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | MRIS |
| Conference Code | 2009-01-MMS-CE-MR |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Three Dimensional Numerical Analysis of Optical Near Field in Bow-tie Type Nano-Aperture of a Metallic Layer |
| Sub Title (in English) | |
| Keyword(1) | Optical near field |
| Keyword(2) | Optical recording |
| Keyword(3) | Nano-aperture |
| Keyword(4) | Metal |
| Keyword(5) | FDTD method |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hiroki Ito |
| 1st Author's Affiliation | Kansai University (Kansai Univ.) |
| 2nd Author's Name | Yiwei He |
| 2nd Author's Affiliation | Osaka Electro-Communication University (Osaka Electro-Communication Univ.) |
| 3rd Author's Name | Toshitaka Kojima |
| 3rd Author's Affiliation | Kansai University (Kansai Univ.) |
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| Speaker | Author-1 |
| Date Time | 2009-01-16 10:00:00 |
| Presentation Time | 30 minutes |
| Registration for | MRIS |
| Paper # | MR2008-59 |
| Volume (vol) | vol.108 |
| Number (no) | no.380 |
| Page | pp.47-52 |
| #Pages | 6 |
| Date of Issue | 2009-01-08 (MR) |
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