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| Presentation | 2009-01-21 12:40 XPS Analysis of the Interface between Transparent Electrode and Organic Layers in Organic Light-Emitting Devices Toshikazu Satoh, Hisayoshi Fujikawa (Toyota Central R&D Labs.,), Ichiro Yamamoto, Takanori Murasaki, Yoshifumi Kato (Toyota Ind Co.)  OME2008-86 Link to ES Tech. Rep. Archives: OME2008-86 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | X-ray photoelectron spectroscopy (XPS) of thin organic layers deposited on indium tin oxide (ITO) was taken place to investigate the degradation of organic light-emitting devices (OLEDs) induced by photo-irradiation and the difference of the characteristics of the OLEDs by the temperature in the deposition process of ITO electrodes. Since the oxidation of the organic layer and the increase of the hole-injecting barrier at the organic / ITO interface were observed, it is suggested that the cause of the degradation exists at the interface. The organic layer on the ITO deposited at room temperature was highly oxidized compared with that on the ITO deposited at high temperature (573 K), and the difference of the characteristics of the OLEDs is able to explain by the results. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Organic Light-Emitting Device / Indium Tin Oxide Electrode / Interface / X-ray Photoelectron Spectroscopy / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 387, OME2008-86, pp. 23-28, Jan. 2009. | |
| Paper # | OME2008-86 | |
| Date of Issue | 2009-01-14 (OME) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | OME2008-86 Link to ES Tech. Rep. Archives: OME2008-86 |
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| Conference Information | |
| Committee | OME |
| Conference Date | 2009-01-21 - 2009-01-21 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ｎａｇｏｙａ Ｕｎｉｖ． |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | OME |
| Conference Code | 2009-01-OME |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | XPS Analysis of the Interface between Transparent Electrode and Organic Layers in Organic Light-Emitting Devices |
| Sub Title (in English) | |
| Keyword(1) | Organic Light-Emitting Device |
| Keyword(2) | Indium Tin Oxide Electrode |
| Keyword(3) | Interface |
| Keyword(4) | X-ray Photoelectron Spectroscopy |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Toshikazu Satoh |
| 1st Author's Affiliation | Toyota Central Research and Development Laboratories (Toyota Central R&D Labs.,) |
| 2nd Author's Name | Hisayoshi Fujikawa |
| 2nd Author's Affiliation | Toyota Central Research and Development Laboratories (Toyota Central R&D Labs.,) |
| 3rd Author's Name | Ichiro Yamamoto |
| 3rd Author's Affiliation | Toyota Industries Corporation (Toyota Ind Co.) |
| 4th Author's Name | Takanori Murasaki |
| 4th Author's Affiliation | Toyota Industries Corporation (Toyota Ind Co.) |
| 5th Author's Name | Yoshifumi Kato |
| 5th Author's Affiliation | Toyota Industries Corporation (Toyota Ind Co.) |
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| Speaker | Author-1 |
| Date Time | 2009-01-21 12:40:00 |
| Presentation Time | 25 minutes |
| Registration for | OME |
| Paper # | OME2008-86 |
| Volume (vol) | vol.108 |
| Number (no) | no.387 |
| Page | pp.23-28 |
| #Pages | 6 |
| Date of Issue | 2009-01-14 (OME) |
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