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| Presentation | 2009-05-28 14:50 De-embedding Method Using EM Simulator Takuichi Hirano (Tokyo Inst. of Tech.), Hiroshi Nakano, Yasutake Hirachi (AMMSYS. Inc.), Jiro Hirokawa, Makoto Ando (Tokyo Inst. of Tech.)  MW2009-15 Link to ES Tech. Rep. Archives: MW2009-15 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Accurate characterization of field effect transistors (FETs) is necessary for precise design of monolithic-microwave integrated-circuits (MMICs). Extraction of FET parameters, or characterization, is difficult because the FET is embedded in the parasitic circuit, which is referred to as test element group (TEG), to connect probe and bias. De-embedding method using open/short-TEG had been widely used in characterization of FETs. But two approximations are used in the conventional de-embedding method using open/short-TEG [1]; (1) incompleteness of open and short pattern, and (2) approximation of a parasitic circuit by an equivalent circuit topology. Those approximations cause ambiguity and non-negligible error especially in high frequency band. So, the authors have proposed the de-embedding method using EM simulator, which is more accurate than the conventional de-embedding method. In the proposed method, S-parameters of the four-port parasitic circuit are analyzed by the EM simulator, and unknown two-port Z(Y)-parameters of the embedded lumped-element device are extracted via matrix algebra. It is verified via numerical simulation that the proposed de-embedding method has higher accuracy than the conventional one, and the error factor in the conventional de-embedding method is mainly due to the equivalent circuit approximation of the parasitic circuit. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | MMIC / FET / De-embedding / Extraction / EM simulator / Lumped-element / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, no. 62, MW2009-15, pp. 35-40, May 2009. | |
| Paper # | MW2009-15 | |
| Date of Issue | 2009-05-21 (MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2009-15 Link to ES Tech. Rep. Archives: MW2009-15 |
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| Conference Information | |
| Committee | MW |
| Conference Date | 2009-05-28 - 2009-05-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Okayama Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Technologies |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2009-05-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | De-embedding Method Using EM Simulator |
| Sub Title (in English) | |
| Keyword(1) | MMIC |
| Keyword(2) | FET |
| Keyword(3) | De-embedding |
| Keyword(4) | Extraction |
| Keyword(5) | EM simulator |
| Keyword(6) | Lumped-element |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Takuichi Hirano |
| 1st Author's Affiliation | Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
| 2nd Author's Name | Hiroshi Nakano |
| 2nd Author's Affiliation | AMMSYS. Inc. (AMMSYS. Inc.) |
| 3rd Author's Name | Yasutake Hirachi |
| 3rd Author's Affiliation | AMMSYS. Inc. (AMMSYS. Inc.) |
| 4th Author's Name | Jiro Hirokawa |
| 4th Author's Affiliation | Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
| 5th Author's Name | Makoto Ando |
| 5th Author's Affiliation | Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2009-05-28 14:50:00 |
| Presentation Time | 25 minutes |
| Registration for | MW |
| Paper # | MW2009-15 |
| Volume (vol) | vol.109 |
| Number (no) | no.62 |
| Page | pp.35-40 |
| #Pages | 6 |
| Date of Issue | 2009-05-21 (MW) |
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