IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-06-19 16:20
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contct Resistance (VI) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.,Ltd.,), Koichiro Sawa (Keio Univ.) EMD2009-19 CPM2009-31 OME2009-26 Link to ES Tech. Rep. Archives: EMD2009-19 CPM2009-31 OME2009-26
Abstract (in Japanese) (See Japanese page) 
(in English) Authors studied the influence on contact resistance by micro-vibration to electrical contacts using hammering oscillation mechanism and sliding contact mechanism in the vertical direction. It was set that the oscillating acceleration was 150G or 400G and the sliding force between male pins and female ones was 0.3N or 2.0N. The first measurement was carried out in the condition of 150G and 2.0N with 42 millions’ operations and the contact resistance was resulted in about 200Ω. The second one was in the condition of 150G and 0.3N with 44 millions’ and it was resulted in about 600-1000Ω. The third one is in the condition of 400G and 2.0N with 22 millions’ and it is resulted in about 200Ω. The fourth or the fifth measurement were carried out in the condition of 2.0N or 2.0N with 24 millions’ or 26 millions’ and they were resulted in about 50-400Ω or 200-600Ω in respectively. It was showed that the starting number of fluctuation of the contact resistance was highest and the distance of the relative sliding was lowest in the case of 150G and 2.0N (measurement 1). It was suggested that the fretting corrosion model or sliding contact one would be applied to the fluctuation of contact resistance.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / sliding contact mechanism / acceleration / contact force / sliding force  
Reference Info. IEICE Tech. Rep., vol. 109, no. 89, EMD2009-19, pp. 27-32, June 2009.
Paper # EMD2009-19 
Date of Issue 2009-06-12 (EMD, CPM, OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2009-19 CPM2009-31 OME2009-26 Link to ES Tech. Rep. Archives: EMD2009-19 CPM2009-31 OME2009-26

Conference Information
Committee CPM EMD OME  
Conference Date 2009-06-19 - 2009-06-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2009-06-CPM-EMD-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Contct Resistance (VI) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) hammering oscillating mechanism  
Keyword(5) sliding contact mechanism  
Keyword(6) acceleration  
Keyword(7) contact force  
Keyword(8) sliding force  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co.,Ltd., (TMC System Co.,Ltd.,)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC System Co.,Ltd., (TMC System Co.,Ltd.,)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System Co.,Ltd., (TMC System Co.,Ltd.,)
4th Author's Name Mitsuo Kikuchi  
4th Author's Affiliation TMC System Co.,Ltd., (TMC System Co.,Ltd.,)
5th Author's Name Hiroaki Kubota  
5th Author's Affiliation TMC System Co.,Ltd., (TMC System Co.,Ltd.,)
6th Author's Name Koichiro Sawa  
6th Author's Affiliation Keio University K2 Campus (Keio Univ.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-2 
Date Time 2009-06-19 16:20:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2009-19, CPM2009-31, OME2009-26 
Volume (vol) vol.109 
Number (no) no.89(EMD), no.90(CPM), no.91(OME) 
Page pp.27-32 
#Pages
Date of Issue 2009-06-12 (EMD, CPM, OME) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan