IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-07-10 09:30
A Study on the Probing Method and Accuracy for CoMPACT Monitor
Kohei Watabe, Yudai Honma, Masaki Aida (Tokyo Metropolitan Univ.) IN2009-30
Abstract (in Japanese) (See Japanese page) 
(in English) CoMPACT monitor is technique to measure detailed per-flow quality of service (QoS). It achieves scalable measurement since QoS data obtained by active measurement is transformed to QoS of individual flow. New probing method of active measurement proposed in recent study has the possibility of improving CoMPACT monitor's accuracy. However, because this research guarantees the accuracy improvement when we estimate the ensemble mean of QoS, we should carefully discuss the application to the CoMPACT monitor that estimate time average. In this paper, we prove the combination of this new probing method and CoMPACT monitor is good.
Keyword (in Japanese) (See Japanese page) 
(in English) CoMPACT monitor / change-of-measure / Gamma distribution / QoS measurement / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 119, IN2009-30, pp. 31-36, July 2009.
Paper # IN2009-30 
Date of Issue 2009-07-02 (IN) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF IN2009-30

Conference Information
Committee IN  
Conference Date 2009-07-09 - 2009-07-10 
Place (in Japanese) (See Japanese page) 
Place (in English) HOKKAIDO UNIVERSITY 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IN 
Conference Code 2009-07-IN 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on the Probing Method and Accuracy for CoMPACT Monitor 
Sub Title (in English)  
Keyword(1) CoMPACT monitor  
Keyword(2) change-of-measure  
Keyword(3) Gamma distribution  
Keyword(4) QoS measurement  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kohei Watabe  
1st Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
2nd Author's Name Yudai Honma  
2nd Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
3rd Author's Name Masaki Aida  
3rd Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2009-07-10 09:30:00 
Presentation Time 25 minutes 
Registration for IN 
Paper # IN2009-30 
Volume (vol) vol.109 
Number (no) no.119 
Page pp.31-36 
#Pages
Date of Issue 2009-07-02 (IN) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan