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Paper Abstract and Keywords
Presentation 2009-07-17 15:20
An experimental study on analysis of contact resistance data with Weibull distribution function
Makoto Hasegawa (Chitose Inst. of Sci. and Tech.) EMD2009-25 Link to ES Tech. Rep. Archives: EMD2009-25
Abstract (in Japanese) (See Japanese page) 
(in English) In order to realize detailed analysis of measured contact resistance data, fitting of Weibull distribution function to contact resistance data is being tried. For that purpose, the original Weibull fitting software has been prepared, and applied to some sets of the measured data. When successful fitting results were obtained, the sum of two Weibull parameters, i.e., the location parameter Ro and the scale parameter Ra, became close to the average value of the contact resistance data. In addition, values of the scale parameter m showed certain differences for the data obtained with different load current values. These tendencies can be effectively utilized for analysis of contact resistance data. However, more revisions to the fitting algorithm are still required for realizing further study of contact resistance characteristics through the Weibull fitting analysis. Specifically, certain modifications are required in providing distribution of the measured contact resistances. The fitting procedures are also required to be improved in order to appropriately handle with a mixed mode distribution of data.
Keyword (in Japanese) (See Japanese page) 
(in English) contact resistance / Weibull distribution function / contact surface / arc discharge / contact failure / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 138, EMD2009-25, pp. 25-30, July 2009.
Paper # EMD2009-25 
Date of Issue 2009-07-10 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2009-25 Link to ES Tech. Rep. Archives: EMD2009-25

Conference Information
Committee EMD  
Conference Date 2009-07-17 - 2009-07-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Chitose Arcadia Plaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2009-07-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An experimental study on analysis of contact resistance data with Weibull distribution function 
Sub Title (in English)  
Keyword(1) contact resistance  
Keyword(2) Weibull distribution function  
Keyword(3) contact surface  
Keyword(4) arc discharge  
Keyword(5) contact failure  
1st Author's Name Makoto Hasegawa  
1st Author's Affiliation Chitose Institute of Science and Technology (Chitose Inst. of Sci. and Tech.)
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Speaker Author-1 
Date Time 2009-07-17 15:20:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2009-25 
Volume (vol) vol.109 
Number (no) no.138 
Page pp.25-30 
Date of Issue 2009-07-10 (EMD) 

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