Paper Abstract and Keywords |
Presentation |
2009-11-30 10:55
Terahertz Response of Aligned Carbon Nanotubes measured by a broadband THz-TDS system using a DAST emitter Yoshiaki Takemoto (Osaka Univ.), Barney Cruz (Rice Univ.), Kei Takeya, Iwao Kawayama, Hironaru Murakami (Osaka Univ.), Lei Ren, Cary L. Pint, Layla G. Booshehri, William D. Rice, Xiangfeug Wang, David J. Hilton, Robert H. Hauge, Junichiro Kono (Rice Univ.), Yoshinori Takahashi, Masashi Yoshimura (Graduate School of Engineering, Osaka Univ) ED2009-170 Link to ES Tech. Rep. Archives: ED2009-170 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We measured a terahertz response of an aligned single-walled carbon nanotube (SWCN) thin film on a sapphire substrate. In the measurements, we used terahertz time domain spectroscopy (THz-TDS) with a DAST crystal, which is a nonlinear organic crystal, as an optical source. This system enable us to measure absorbance of a SWCN thin film from 0.5 THz to about 5 THz. The results showed that the film worked as a good polarizer with over 0.9 degree of polarization in 0.5 THz to 3 THz. However the absorption of the film increased around 4 THz and it decreases the degree of polarization. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
THz / DAST / Carbon nanotube / Polarizer / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 313, ED2009-170, pp. 59-63, Nov. 2009. |
Paper # |
ED2009-170 |
Date of Issue |
2009-11-22 (ED) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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ED2009-170 Link to ES Tech. Rep. Archives: ED2009-170 |
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