Paper Abstract and Keywords |
Presentation |
2009-12-14 13:30
[Poster Presentation]
Simulation of Substrate Noise Impact on CMOS Analog Circuit Satoshi Takaya, Yoji Bando, Makoto Nagata (Kobe Univ.) ICD2009-81 Link to ES Tech. Rep. Archives: ICD2009-81 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have measured and simulated substrate noise impact on basic analog amplifier using 90-nm CMOS test chip. To measure substrate noise impact on amplifier, we built the experiment system that could monitor substrate noise and output signal of the amplifier. In this experiment system, substrate noise was generated by injecting AC signal from off-chip to substrate of this test chip. The evaluation result shows that substrate noise impacts an amplifier and the sensitivity is different on differential amplifier. On the other hand we simulated substrate noise impact on amplifier including a power supply and ground model. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Mixed signal LSI / Substrate noise / Noise response / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 336, ICD2009-81, pp. 31-34, Dec. 2009. |
Paper # |
ICD2009-81 |
Date of Issue |
2009-12-07 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2009-81 Link to ES Tech. Rep. Archives: ICD2009-81 |
Conference Information |
Committee |
ICD |
Conference Date |
2009-12-14 - 2009-12-15 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Shizuoka University (Hamamatsu) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2009-12-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Simulation of Substrate Noise Impact on CMOS Analog Circuit |
Sub Title (in English) |
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Keyword(1) |
Mixed signal LSI |
Keyword(2) |
Substrate noise |
Keyword(3) |
Noise response |
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1st Author's Name |
Satoshi Takaya |
1st Author's Affiliation |
Kobe University (Kobe Univ.) |
2nd Author's Name |
Yoji Bando |
2nd Author's Affiliation |
Kobe University (Kobe Univ.) |
3rd Author's Name |
Makoto Nagata |
3rd Author's Affiliation |
Kobe University (Kobe Univ.) |
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Speaker |
Author-1 |
Date Time |
2009-12-14 13:30:00 |
Presentation Time |
190 minutes |
Registration for |
ICD |
Paper # |
ICD2009-81 |
Volume (vol) |
vol.109 |
Number (no) |
no.336 |
Page |
pp.31-34 |
#Pages |
4 |
Date of Issue |
2009-12-07 (ICD) |