Paper Abstract and Keywords |
Presentation |
2010-02-15 13:45
A Test Compaction Oriented Control Point Insertion Method for Transition Faults Yoshitaka Yumoto, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.) DC2009-72 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The recent advances in semiconductor processing technology have resulted in the exponential increase in LSI circuit density. The number of test patterns increases in proportion to the number of gates on LSIs. In stuck-at fault testing, it is difficult to detect defects with timing delay and shorts between signal lines. Thus, in addition to detection of stuck-at faults, it is important to detect transition faults and bridging faults. In this paper, we propose a control point insertion method on broadside testing to reduce the number of test patterns for transition faults. It is considered that because the number of don't care bits in test patterns increases by control point insertion, the efficiency for test compaction is improved. Experimental results for ISCAS'89 benchmark circuits show that the proposed control point insertion method is effective to reduce the number of test patterns. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
transition faults / broadside testing / test point insertion / control points / test compaction / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 416, DC2009-72, pp. 45-50, Feb. 2010. |
Paper # |
DC2009-72 |
Date of Issue |
2010-02-08 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2009-72 |
Conference Information |
Committee |
DC |
Conference Date |
2010-02-15 - 2010-02-15 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
DC |
Conference Code |
2010-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Test Compaction Oriented Control Point Insertion Method for Transition Faults |
Sub Title (in English) |
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Keyword(1) |
transition faults |
Keyword(2) |
broadside testing |
Keyword(3) |
test point insertion |
Keyword(4) |
control points |
Keyword(5) |
test compaction |
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1st Author's Name |
Yoshitaka Yumoto |
1st Author's Affiliation |
Nihon University (Nihon Univ.) |
2nd Author's Name |
Toshinori Hosokawa |
2nd Author's Affiliation |
Nihon University (Nihon Univ.) |
3rd Author's Name |
Masayoshi Yoshimura |
3rd Author's Affiliation |
Kyusyu University (Kyusyu Univ.) |
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Speaker |
Author-1 |
Date Time |
2010-02-15 13:45:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2009-72 |
Volume (vol) |
vol.109 |
Number (no) |
no.416 |
Page |
pp.45-50 |
#Pages |
6 |
Date of Issue |
2010-02-08 (DC) |
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