IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-03-05 10:30
Phase Noise Analysis of FET Oscillators based on Forced-Oscillation Model
Sonshu Sakihara, Osami Ishida (Okinawa Nati Coll. of Tech.), Takashi Ohira (Toyohashi Univ. of Tech.) MW2009-202 Link to ES Tech. Rep. Archives: MW2009-202
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents phase noise analysis of FET oscillators based on forced oscillation model. Output noise at the load resistance is formulated for Hartley oscillator with a noise source between drain and source. Assuming the noise is sinusoidal in short term, forced oscillation model is applied.
The output noise formula is reduced to the Leeson's equation by applying the active $Q$ factor. The theory is conformed for other topology of oscillators.
Keyword (in Japanese) (See Japanese page) 
(in English) oscillator / phase noise / active Q factor / forced oscillation / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 431, MW2009-202, pp. 133-135, March 2010.
Paper # MW2009-202 
Date of Issue 2010-02-25 (MW) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2009-202 Link to ES Tech. Rep. Archives: MW2009-202

Conference Information
Committee MW  
Conference Date 2010-03-04 - 2010-03-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Ryukoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave Technologies 
Paper Information
Registration To MW 
Conference Code 2010-03-MW 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Phase Noise Analysis of FET Oscillators based on Forced-Oscillation Model 
Sub Title (in English)  
Keyword(1) oscillator  
Keyword(2) phase noise  
Keyword(3) active Q factor  
Keyword(4) forced oscillation  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Sonshu Sakihara  
1st Author's Affiliation Okinawa National College of Technology (Okinawa Nati Coll. of Tech.)
2nd Author's Name Osami Ishida  
2nd Author's Affiliation Okinawa National College of Technology (Okinawa Nati Coll. of Tech.)
3rd Author's Name Takashi Ohira  
3rd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2010-03-05 10:30:00 
Presentation Time 20 minutes 
Registration for MW 
Paper # MW2009-202 
Volume (vol) vol.109 
Number (no) no.431 
Page pp.133-135 
#Pages
Date of Issue 2010-02-25 (MW) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan