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Paper Abstract and Keywords
Presentation 2010-06-18 10:25
Theoretical analysis of operating conditions to suppress relaxation oscillations in Resonant Tunneling Diode biased at negative differential resistance region
Yosuke Itagaki, Kiyoto Asakawa, Hideaki Shin-ya, Mitsufumi Saito, Michihiko Suhara (Tokyo Metro.Univ) ED2010-43 Link to ES Tech. Rep. Archives: ED2010-43
Abstract (in Japanese) (See Japanese page) 
(in English) A resonant tunneling diode (RTD) is an active device with negative differential resistance operating up to THz region in principle. However, parasitic resistances, inductances and capacitances determine not only a limit of operating frequency but also condition of relaxation oscillations in output of RTD. A purpose of this paper is to clarify the condition suppressing the relaxation oscillation by modeling RTD with an equivalent circuit of RTD including DC supply and a stabilizer circuit. Especially, we analyze the difference of characteristics between schottky barrier diode and a resistance employed as the stabilizer circuit. In addition, relaxation time toward a steady operating point is also investigated.
Keyword (in Japanese) (See Japanese page) 
(in English) Resonant tunneling diode / Stabilizer Circuit / Phase space / Relaxation oscillation / Negative differential resistance / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 80, ED2010-43, pp. 53-58, June 2010.
Paper # ED2010-43 
Date of Issue 2010-06-10 (ED) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2010-43 Link to ES Tech. Rep. Archives: ED2010-43

Conference Information
Committee ED  
Conference Date 2010-06-17 - 2010-06-18 
Place (in Japanese) (See Japanese page) 
Place (in English) JAIST 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process and device technology of semiconductors (surface, interface, reliability, etc.) 
Paper Information
Registration To ED 
Conference Code 2010-06-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Theoretical analysis of operating conditions to suppress relaxation oscillations in Resonant Tunneling Diode biased at negative differential resistance region 
Sub Title (in English)  
Keyword(1) Resonant tunneling diode  
Keyword(2) Stabilizer Circuit  
Keyword(3) Phase space  
Keyword(4) Relaxation oscillation  
Keyword(5) Negative differential resistance  
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Keyword(7)  
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1st Author's Name Yosuke Itagaki  
1st Author's Affiliation Tokyo Metropolitan University (Tokyo Metro.Univ)
2nd Author's Name Kiyoto Asakawa  
2nd Author's Affiliation Tokyo Metropolitan University (Tokyo Metro.Univ)
3rd Author's Name Hideaki Shin-ya  
3rd Author's Affiliation Tokyo Metropolitan University (Tokyo Metro.Univ)
4th Author's Name Mitsufumi Saito  
4th Author's Affiliation Tokyo Metropolitan University (Tokyo Metro.Univ)
5th Author's Name Michihiko Suhara  
5th Author's Affiliation Tokyo Metropolitan University (Tokyo Metro.Univ)
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Speaker Author-1 
Date Time 2010-06-18 10:25:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2010-43 
Volume (vol) vol.110 
Number (no) no.80 
Page pp.53-58 
#Pages
Date of Issue 2010-06-10 (ED) 


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