Paper Abstract and Keywords |
Presentation |
2010-06-21 11:40
Layout-Aware Variation Modeling and Its Application to Opamp Design Kouta Shinohara, Mihoko Hidaka, Qing Dong, Jing Li, Shigetoshi Nakatake (Univ. of Kitakyushu) CAS2010-7 VLD2010-17 SIP2010-28 CST2010-7 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
As geometrical scaling of the transistor dimensions, such as feature
size and supply voltage, has dominated the semiconductor industry
for greater chip density, the variation analysis of transistor
characteristic also becomes more critical important for analog
integrated circuit design. In this paper, we present a model for the
layout structure dependent variation according to the variation data
got from a TEG(test element group) chip, then a correlation analysis
is made between the result of Monte Carlo analysis based on this
model and the experimental verification result for the offset
voltage variation in a 90nm Op-Amp. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
analog layout design / layout-aware variation / Monte Carlo analysis / Op-Amp design / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 87, VLD2010-17, pp. 37-41, June 2010. |
Paper # |
VLD2010-17 |
Date of Issue |
2010-06-14 (CAS, VLD, SIP, CST) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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CAS2010-7 VLD2010-17 SIP2010-28 CST2010-7 |
Conference Information |
Committee |
CAS MSS VLD SIP |
Conference Date |
2010-06-21 - 2010-06-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kitami Institute of Technology |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
VLD |
Conference Code |
2010-06-CAS-CST-VLD-SIP |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Layout-Aware Variation Modeling and Its Application to Opamp Design |
Sub Title (in English) |
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Keyword(1) |
analog layout design |
Keyword(2) |
layout-aware variation |
Keyword(3) |
Monte Carlo analysis |
Keyword(4) |
Op-Amp design |
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1st Author's Name |
Kouta Shinohara |
1st Author's Affiliation |
The University of Kitakyushu (Univ. of Kitakyushu) |
2nd Author's Name |
Mihoko Hidaka |
2nd Author's Affiliation |
The University of Kitakyushu (Univ. of Kitakyushu) |
3rd Author's Name |
Qing Dong |
3rd Author's Affiliation |
The University of Kitakyushu (Univ. of Kitakyushu) |
4th Author's Name |
Jing Li |
4th Author's Affiliation |
The University of Kitakyushu (Univ. of Kitakyushu) |
5th Author's Name |
Shigetoshi Nakatake |
5th Author's Affiliation |
The University of Kitakyushu (Univ. of Kitakyushu) |
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Speaker |
Author-1 |
Date Time |
2010-06-21 11:40:00 |
Presentation Time |
25 minutes |
Registration for |
VLD |
Paper # |
CAS2010-7, VLD2010-17, SIP2010-28, CST2010-7 |
Volume (vol) |
vol.110 |
Number (no) |
no.86(CAS), no.87(VLD), no.88(SIP), no.89(CST) |
Page |
pp.37-41 |
#Pages |
5 |
Date of Issue |
2010-06-14 (CAS, VLD, SIP, CST) |
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