Paper Abstract and Keywords |
Presentation |
2010-07-02 16:20
New Method for Evaluating the Scaling Trend of Nano-Electro-Mechanical (NEM) Nonvolatile Memory Cells Seung Hyeun Roh, Woo Young Choi (Sogang Univ.) ED2010-102 SDM2010-103 Link to ES Tech. Rep. Archives: ED2010-102 SDM2010-103 |
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Reference Info. |
IEICE Tech. Rep., vol. 110, no. 109, ED2010-102, pp. 231-232, June 2010. |
Paper # |
ED2010-102 |
Date of Issue |
2010-06-23 (ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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ED2010-102 SDM2010-103 Link to ES Tech. Rep. Archives: ED2010-102 SDM2010-103 |
Conference Information |
Committee |
ED SDM |
Conference Date |
2010-06-30 - 2010-07-02 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tokyo Inst. of Tech. Ookayama Campus |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
2010 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices |
Paper Information |
Registration To |
ED |
Conference Code |
2010-06-ED-SDM |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
New Method for Evaluating the Scaling Trend of Nano-Electro-Mechanical (NEM) Nonvolatile Memory Cells |
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1st Author's Name |
Seung Hyeun Roh |
1st Author's Affiliation |
Sogang University (Sogang Univ.) |
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Woo Young Choi |
2nd Author's Affiliation |
Sogang University (Sogang Univ.) |
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Speaker |
Author-1 |
Date Time |
2010-07-02 16:20:00 |
Presentation Time |
15 minutes |
Registration for |
ED |
Paper # |
ED2010-102, SDM2010-103 |
Volume (vol) |
vol.110 |
Number (no) |
no.109(ED), no.110(SDM) |
Page |
pp.231-232 |
#Pages |
2 |
Date of Issue |
2010-06-23 (ED, SDM) |
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