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| Presentation | 2010-07-08 14:30 [Invited Talk] Development of Pseudo-hcp Thin Films for Perpendicular Recording Media Shin Saito, Migaku Takahashi (Tohoku Univ.)  MR2010-15 Link to ES Tech. Rep. Archives: MR2010-15 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Measurement of the stacking faults (SFs) formed in a pseudo-hexagonal closed packed (pseudo-hcp) film is proposed using laboratory-scale X-ray diffractometer. The pseudo-hcp structure includes (111)-oriented face centered cubic (fcc), c-plane oriented hcp, and their mediate structures with the SFs. Diffractions from (11.0) and (10.0) planes, DH and DL, were observed in the in-plane X-ray diffraction (XRD) profiles of the pseudo-hcp materials. The structure factor revealed that DH and DL originates from the number of total atomic layers and the imbalance of the number of A, B, and C atomic layers, respectively. Therefore, the intensity ratio of DH to DL, corrected by Lorentz-polarization and atomic scattering factors (corrected IL/IH), is defined as the degree of SFs for pseudo-hcp materials from the stacking probability, independent of thickness, compositional atoms, and lattice constants. Theoretical values of the corrected IL/IH are 0.25 for perfect hcp stacking and 0 for perfect fcc stacking, and statistical calculations revealed that this index is very sensitive to the approach of perfect hcp stacking order rather than that of perfect fcc stacking order. By applying this evaluation to experimentally sputtered thin films, it was clarified that critical number of valence electron for fcc-hcp transition was found to be “9” for a transition-metal alloy thin film. Proposed evaluation is quite useful for material and process development of perpendicular recording media. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Stacking faults / Pseudo- hexagonal closed packed structure / In-plane XRD / Number of valence electron / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, July 2010. | |
| Paper # | ||
| Date of Issue | 2010-07-01 (MR) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MR2010-15 Link to ES Tech. Rep. Archives: MR2010-15 |
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| Conference Information | |
| Committee | ITE-MMS MRIS |
| Conference Date | 2010-07-08 - 2010-07-09 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ibaraki Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | MRIS |
| Conference Code | 2010-07-MMS-MR |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Development of Pseudo-hcp Thin Films for Perpendicular Recording Media |
| Sub Title (in English) | |
| Keyword(1) | Stacking faults |
| Keyword(2) | Pseudo- hexagonal closed packed structure |
| Keyword(3) | In-plane XRD |
| Keyword(4) | Number of valence electron |
| Keyword(5) | |
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| Keyword(8) | |
| 1st Author's Name | Shin Saito |
| 1st Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 2nd Author's Name | Migaku Takahashi |
| 2nd Author's Affiliation | Tohoku University (Tohoku Univ.) |
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| Speaker | Author-1 |
| Date Time | 2010-07-08 14:30:00 |
| Presentation Time | 45 minutes |
| Registration for | MRIS |
| Paper # | MR2010-15 |
| Volume (vol) | vol.110 |
| Number (no) | no.112 |
| Page | pp.17-24 |
| #Pages | 8 |
| Date of Issue | 2010-07-01 (MR) |
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