Paper Abstract and Keywords |
Presentation |
2010-11-12 13:15
A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism
-- Modeling (10) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111 Link to ES Tech. Rep. Archives: EMD2010-111 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the vertical direction has been developed and the influences of a micro-oscillation on contact resistance have been studied. The mechanism could make a study of actual degradation phenomenon on contacts by the influences of a micro-oscillation.
First, a mathematical approach in the mechanism of hammering and consequently occurred oscillation using plate dynamic theory was carried out by linearly combination of some functions and a unit step functions as external force in time and space field. According to the approach, dynamical characteristics of the mechanism were analyzed by constructing a model of a thin plate with some initial conditions, boundary conditions and a transformation of wave functions. By comparing the modeling analysis with experimental results, it was shown that the model could express, to some extent, the actual oscillation on a thin plate.
Second, another mathematical approach in the interface on electrical contacts was carried out by considering both Coulomb’s frictional force and inertial force adding to the former model. By comparing the modeling method with experimental results, it was suggested that the method could explain, to some extent, the more actual oscillation on the thin plate.
By two models it was suggested that the dynamical characteristics of the mechanism, such as displacement, acceleration and mechanical energy, could be derived from linear combinations of basal functions. And using two methods it was thought, to some extent, that a source of the fluctuation of contact resistance caused by the hammering oscillation could be analyzed. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / contact resistance / degradation phenomenon / hammering oscillating mechanism / micro-oscillation / Coulomb’s frictional force / inertial force / mathematical model |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 270, EMD2010-111, pp. 185-188, Nov. 2010. |
Paper # |
EMD2010-111 |
Date of Issue |
2010-11-04 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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EMD2010-111 Link to ES Tech. Rep. Archives: EMD2010-111 |
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