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Paper Abstract and Keywords
Presentation 2010-12-17 14:50
Comparison of the Error Correction Methods for SSDs and Dynamic Codeword Transition ECC Scheme
Shuhei Tanakamaru (Univ. of Tokyo), Atsushi Esumi, Mitsuyoshi Ito, Kai Li (SIGLEAD), Ken Takeuchi (Univ. of Tokyo) ICD2010-124 Link to ES Tech. Rep. Archives: ICD2010-124
Abstract (in Japanese) (See Japanese page) 
(in English) This paper compares error correcting codes (ECC) such as RS code and BCH code as an ECC for SSDs and introduces dynamic codeword transition ECC scheme for highly reliable SSDs. By monitoring the error number or the write / erase cycles, the ECC codeword dynamically increases from 512Byte (+parity) to 1KByte, 2KByte, 4KByte…32KByte. The proposed ECC with a larger codeword decreases the failure rate after ECC. Because the parity rate per codeword is the same in each ECC codeword, no additional memory area is required so that the reliability of SSD is improved after the manufacturing without cost penalty.
Keyword (in Japanese) (See Japanese page) 
(in English) ECC / Error correcting code / SSD / NAND Flash memory / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 344, ICD2010-124, pp. 147-152, Dec. 2010.
Paper # ICD2010-124 
Date of Issue 2010-12-09 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2010-124 Link to ES Tech. Rep. Archives: ICD2010-124

Conference Information
Committee ICD  
Conference Date 2010-12-16 - 2010-12-17 
Place (in Japanese) (See Japanese page) 
Place (in English) RCAST, Univ. of Tokyo 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Workshop for Graduate Student and Young Researchers 
Paper Information
Registration To ICD 
Conference Code 2010-12-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Comparison of the Error Correction Methods for SSDs and Dynamic Codeword Transition ECC Scheme 
Sub Title (in English)  
Keyword(1) ECC  
Keyword(2) Error correcting code  
Keyword(3) SSD  
Keyword(4) NAND Flash memory  
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1st Author's Name Shuhei Tanakamaru  
1st Author's Affiliation University of Tokyo (Univ. of Tokyo)
2nd Author's Name Atsushi Esumi  
2nd Author's Affiliation SIGLED Inc. (SIGLEAD)
3rd Author's Name Mitsuyoshi Ito  
3rd Author's Affiliation SIGLED Inc. (SIGLEAD)
4th Author's Name Kai Li  
4th Author's Affiliation SIGLED Inc. (SIGLEAD)
5th Author's Name Ken Takeuchi  
5th Author's Affiliation University of Tokyo (Univ. of Tokyo)
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Date Time 2010-12-17 14:50:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2010-124 
Volume (vol) vol.110 
Number (no) no.344 
Page pp.147-152 
#Pages
Date of Issue 2010-12-09 (ICD) 


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