| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2011-01-28 15:40 Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (1) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT)  EMD2010-141 Link to ES Tech. Rep. Archives: EMD2010-141 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering oscillation mechanism (HOM), a sliding contact mechanism (SCM) and a 3 dimensional oscillating mechanism (3DOM). However, it was difficult to inspect the degradation phenomenon of electrical contacts in relatively larger systems or in equipments in the field by means of the mechanisms in which the objective materials were requested to be on the stage. Therefore they have developed and made a handy “tapping device (TPD)” experimentally without a special stage for the inspection but with quantitative property to some extent. It was suggested that the device could provide the oscillations for the objects with constant loads and energies but without regard to proficient operators’ skills. And it was shown that the dynamical characteristics of the device were able to be analyzed by virtue of mathematical and mechanical models. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / micro-oscillation / contact resistance / tapping device / hammering oscillating mechanism / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 403, EMD2010-141, pp. 35-40, Jan. 2011. | |
| Paper # | EMD2010-141 | |
| Date of Issue | 2011-01-21 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2010-141 Link to ES Tech. Rep. Archives: EMD2010-141 |
|
| Conference Information | |
| Committee | EMD |
| Conference Date | 2011-01-28 - 2011-01-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Japan Aviation Electronics Industry,Limited |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Electromechanical Devices |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2011-01-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts by a tapping device |
| Sub Title (in English) | A tapping device for trial (1) |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | tapping device |
| Keyword(5) | hammering oscillating mechanism |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 2nd Author's Name | Keiji Koshida |
| 2nd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 3rd Author's Name | Saindaa Norovling |
| 3rd Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 4th Author's Name | Masahiro Kawanobe |
| 4th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 5th Author's Name | Daiki Ishizuka |
| 5th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 6th Author's Name | Kunio Yanagi |
| 6th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 7th Author's Name | Masayoshi Kotabe |
| 7th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 8th Author's Name | Hiroaki Kubota |
| 8th Author's Affiliation | TMC System Co. Ltd. (TMC) |
| 9th Author's Name | Nobuhiro Kuga |
| 9th Author's Affiliation | Yokohama National University (Yokohama Nat'l Univ.) |
| 10th Author's Name | Koichiro Sawa |
| 10th Author's Affiliation | Nippon Institute of Technology (NIT) |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2011-01-28 15:40:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | EMD2010-141 |
| Volume (vol) | vol.110 |
| Number (no) | no.403 |
| Page | pp.35-40 |
| #Pages | 6 |
| Date of Issue | 2011-01-21 (EMD) |
[Return to Top Page]