IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-05-13 13:30
[Invited Talk] The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations -- Non-electrical-contact fault localization in LSI chips --
Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) R2011-8
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 33, R2011-8, pp. 1-6, May 2011.
Paper # R2011-8 
Date of Issue 2011-05-06 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2011-8

Conference Information
Committee R  
Conference Date 2011-05-13 - 2011-05-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kochi City Culture-Plaza Cul-Port 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2011-05-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations 
Sub Title (in English) Non-electrical-contact fault localization in LSI chips 
Keyword(1)  
Keyword(2)  
Keyword(3)  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kiyoshi Nikawa  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Masatsugu Yamashita  
2nd Author's Affiliation RIKEN (RIKEN)
3rd Author's Name Toru Matsumoto  
3rd Author's Affiliation Hamamatsu Photonics (HPK)
4th Author's Name Katsuyoshi Miura  
4th Author's Affiliation Osaka University (Osaka Univ.)
5th Author's Name Yoshihiro Midoh  
5th Author's Affiliation Osaka University (Osaka Univ.)
6th Author's Name Koji Nakamae  
6th Author's Affiliation Osaka University (Osaka Univ.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2011-05-13 13:30:00 
Presentation Time 40 minutes 
Registration for R 
Paper # R2011-8 
Volume (vol) vol.111 
Number (no) no.33 
Page pp.1-6 
#Pages
Date of Issue 2011-05-06 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan