Paper Abstract and Keywords |
Presentation |
2011-05-13 17:15
Candidate Fault Portions Detection using CMOS Transistor Operation Point Analysis Kazuaki Kishi, Masaru Sanada (KUT) R2011-14 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have developed fault diagnosis software with easy operation, high diagnosis accuracy and fast processing speed. The technology is the way to embed the candidate fault pattern in fault area circuit detected by public technique, and to calculate output voltage value in it. The former fault patterns are adjoin-lines crossed-lines and via-holes. The latter output voltage calculate is based on analysis of Transistor operation point. First, the method is to take out penetration current net from in the candidate fault area, to calculate impedance value of Tr on the current net, to form impedance (Z)net, next to calculate voltage value each the net node, and to decide the portion accord with real fault logic as defect point. Z value is determined using Tr geometry (L/W) and Tr operation point synchronized with gate voltage. The report is introduced the structure of software and algorithm. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
LSI / CMOS / Fault Diagnosis / Operation Point Analysis / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 33, R2011-14, pp. 35-40, May 2011. |
Paper # |
R2011-14 |
Date of Issue |
2011-05-06 (R) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
R2011-14 |
Conference Information |
Committee |
R |
Conference Date |
2011-05-13 - 2011-05-13 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kochi City Culture-Plaza Cul-Port |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
|
Paper Information |
Registration To |
R |
Conference Code |
2011-05-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Candidate Fault Portions Detection using CMOS Transistor Operation Point Analysis |
Sub Title (in English) |
|
Keyword(1) |
LSI |
Keyword(2) |
CMOS |
Keyword(3) |
Fault Diagnosis |
Keyword(4) |
Operation Point Analysis |
Keyword(5) |
|
Keyword(6) |
|
Keyword(7) |
|
Keyword(8) |
|
1st Author's Name |
Kazuaki Kishi |
1st Author's Affiliation |
Kochi University of Technology (KUT) |
2nd Author's Name |
Masaru Sanada |
2nd Author's Affiliation |
Kochi University of Technology (KUT) |
3rd Author's Name |
|
3rd Author's Affiliation |
() |
4th Author's Name |
|
4th Author's Affiliation |
() |
5th Author's Name |
|
5th Author's Affiliation |
() |
6th Author's Name |
|
6th Author's Affiliation |
() |
7th Author's Name |
|
7th Author's Affiliation |
() |
8th Author's Name |
|
8th Author's Affiliation |
() |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2011-05-13 17:15:00 |
Presentation Time |
25 minutes |
Registration for |
R |
Paper # |
R2011-14 |
Volume (vol) |
vol.111 |
Number (no) |
no.33 |
Page |
pp.35-40 |
#Pages |
6 |
Date of Issue |
2011-05-06 (R) |
|