Paper Abstract and Keywords |
Presentation |
2011-07-21 11:45
Design of Radical Sensor LSI with RF-CMOS Technology
-- Sensitivity Analysis of the Detecting Circuit of ESR -- Shunsuke Kimura, Junichi Akita, Akio Kitagawa (Kanazawa Univ.) ICD2011-24 Link to ES Tech. Rep. Archives: ICD2011-24 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The detecting circuit of Electron Spin Resonance (ESR) for radical sensing and the detection sensitivity analysis of ESR signal are presented. The circuit is composed of probe-inductor for ESR measurement and cascode Low Noise Amplifier (LNA) which improves the detection sensitivity of ESR signal. ESR signal is obtained as a spectrum of the gain variation of the LNA as a function of the DC magnetic flux. As the result of circuit simulation, the detection sensitivity of ESR signal by the designed circuit is estimated at 90×10-3fV/spin@RFin=-50dBm. It is possible to detect radicals included in a very small amount of sample with the proposed circuit which contributed to downsizing the ESR measurement system. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
radical / Electron Spin Resonance / RF-CMOS / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 151, ICD2011-24, pp. 31-35, July 2011. |
Paper # |
ICD2011-24 |
Date of Issue |
2011-07-14 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2011-24 Link to ES Tech. Rep. Archives: ICD2011-24 |
Conference Information |
Committee |
ICD ITE-IST |
Conference Date |
2011-07-21 - 2011-07-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hiroshima Institute of Technology |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Analog, Mixed analog and digital, RF, and sensor interface circuitry |
Paper Information |
Registration To |
ICD |
Conference Code |
2011-07-ICD-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Design of Radical Sensor LSI with RF-CMOS Technology |
Sub Title (in English) |
Sensitivity Analysis of the Detecting Circuit of ESR |
Keyword(1) |
radical |
Keyword(2) |
Electron Spin Resonance |
Keyword(3) |
RF-CMOS |
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1st Author's Name |
Shunsuke Kimura |
1st Author's Affiliation |
Kanazawa University (Kanazawa Univ.) |
2nd Author's Name |
Junichi Akita |
2nd Author's Affiliation |
Kanazawa University (Kanazawa Univ.) |
3rd Author's Name |
Akio Kitagawa |
3rd Author's Affiliation |
Kanazawa University (Kanazawa Univ.) |
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Speaker |
Author-1 |
Date Time |
2011-07-21 11:45:00 |
Presentation Time |
25 minutes |
Registration for |
ICD |
Paper # |
ICD2011-24 |
Volume (vol) |
vol.111 |
Number (no) |
no.151 |
Page |
pp.31-35 |
#Pages |
5 |
Date of Issue |
2011-07-14 (ICD) |
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