Paper Abstract and Keywords |
Presentation |
2011-07-22 10:50
A Diagnosis Testbench of Analog IP Cores Against On-Chip Environmental Disturbances Yuuki Araga, Takushi Hashida, Shinichiro Ueyama, Makoto Nagata (Kobe Univ.) ICD2011-29 Link to ES Tech. Rep. Archives: ICD2011-29 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Analog IP cores exhibit a multivariate response to dynamic variations of an operation environment,
that are typically represented by power and substrate voltage changes. A testbench provides a silicon area to embed
and diagnose custom IP cores with power delivery and substrate networks, where the area is surrounded by on-chip
precision waveform capturing and configurable power and substrate noise generation circuits. The coefficients of
noise propagation and noise coupling are quantitatively derived for fabless IP cores processed in a target technology. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Mixed signal LSI / On-chip testing / Testbench / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 151, ICD2011-29, pp. 79-84, July 2011. |
Paper # |
ICD2011-29 |
Date of Issue |
2011-07-14 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2011-29 Link to ES Tech. Rep. Archives: ICD2011-29 |
Conference Information |
Committee |
ICD ITE-IST |
Conference Date |
2011-07-21 - 2011-07-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hiroshima Institute of Technology |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Analog, Mixed analog and digital, RF, and sensor interface circuitry |
Paper Information |
Registration To |
ICD |
Conference Code |
2011-07-ICD-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Diagnosis Testbench of Analog IP Cores Against On-Chip Environmental Disturbances |
Sub Title (in English) |
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Keyword(1) |
Mixed signal LSI |
Keyword(2) |
On-chip testing |
Keyword(3) |
Testbench |
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1st Author's Name |
Yuuki Araga |
1st Author's Affiliation |
Kobe University (Kobe Univ.) |
2nd Author's Name |
Takushi Hashida |
2nd Author's Affiliation |
Kobe University (Kobe Univ.) |
3rd Author's Name |
Shinichiro Ueyama |
3rd Author's Affiliation |
Kobe University (Kobe Univ.) |
4th Author's Name |
Makoto Nagata |
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Kobe University (Kobe Univ.) |
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Speaker |
Author-1 |
Date Time |
2011-07-22 10:50:00 |
Presentation Time |
25 minutes |
Registration for |
ICD |
Paper # |
ICD2011-29 |
Volume (vol) |
vol.111 |
Number (no) |
no.151 |
Page |
pp.79-84 |
#Pages |
6 |
Date of Issue |
2011-07-14 (ICD) |
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