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| Presentation | 2011-07-22 09:25 All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator Tetsuya Iizuka, Kunihiro Asada (Univ. of Tokyo)  ICD2011-26 Link to ES Tech. Rep. Archives: ICD2011-26 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring oscillator. The proposed circuit monitors the PMOS and NMOS process variabilities independently according to a count number of a single pulse which propagates on the ring during the buffer ring mode, and a oscillation frequency during the ring oscillator mode. Using this shared-ring structure, we reduce the occupation area about 40% without loss of process variability monitoring properties compared with the conventional circuit. The proposed shared-ring circuit has been fabricated in 65nm CMOS process and the measurement results with two different wafer lots show the feasibility of the proposed process variability monitoring scheme. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | process variability / on-chip monitor / buffer ring / all digital / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 151, ICD2011-26, pp. 63-68, July 2011. | |
| Paper # | ICD2011-26 | |
| Date of Issue | 2011-07-14 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2011-26 Link to ES Tech. Rep. Archives: ICD2011-26 |
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| Conference Information | |
| Committee | ICD ITE-IST |
| Conference Date | 2011-07-21 - 2011-07-22 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hiroshima Institute of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Analog, Mixed analog and digital, RF, and sensor interface circuitry |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2011-07-ICD-IST |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator |
| Sub Title (in English) | |
| Keyword(1) | process variability |
| Keyword(2) | on-chip monitor |
| Keyword(3) | buffer ring |
| Keyword(4) | all digital |
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| 1st Author's Name | Tetsuya Iizuka |
| 1st Author's Affiliation | University of Tokyo (Univ. of Tokyo) |
| 2nd Author's Name | Kunihiro Asada |
| 2nd Author's Affiliation | University of Tokyo (Univ. of Tokyo) |
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| Speaker | Author-1 |
| Date Time | 2011-07-22 09:25:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | ICD2011-26 |
| Volume (vol) | vol.111 |
| Number (no) | no.151 |
| Page | pp.63-68 |
| #Pages | 6 |
| Date of Issue | 2011-07-14 (ICD) |
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