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| Presentation | 2011-07-22 10:25 Analysis Methods of Substrate Sensitivity in an Analog Circiut Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.)  ICD2011-28 Link to ES Tech. Rep. Archives: ICD2011-28 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Substrate noise sensitivity of an analog circuit consists of the sensitivity of a device and noise propagation from the noise source to the target circuit. It is necessary for substrate noise coupling analysis to consider the physical layout of the divide and the noise propagation by the finger unit. To confirm this, we measure substrate noise sensitivity using evaluation system of analog amplifiers. An ad-hoc model in consideration of a physical layout is effective as an substrate noise coupling analysis model in an analog circuit. And we generalize this substrate model and analytical technique. The combination technique with the analysis result of the chip-level substrate propagation analysis tool is performed. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | mixedsignal VLSI / substrate crosstalk / on-chip monitor / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 151, ICD2011-28, pp. 73-78, July 2011. | |
| Paper # | ICD2011-28 | |
| Date of Issue | 2011-07-14 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2011-28 Link to ES Tech. Rep. Archives: ICD2011-28 |
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| Conference Information | |
| Committee | ICD ITE-IST |
| Conference Date | 2011-07-21 - 2011-07-22 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hiroshima Institute of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Analog, Mixed analog and digital, RF, and sensor interface circuitry |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2011-07-ICD-IST |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis Methods of Substrate Sensitivity in an Analog Circiut |
| Sub Title (in English) | |
| Keyword(1) | mixedsignal VLSI |
| Keyword(2) | substrate crosstalk |
| Keyword(3) | on-chip monitor |
| Keyword(4) | |
| Keyword(5) | |
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| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Satoshi Takaya |
| 1st Author's Affiliation | Kobe University (Kobe Univ.) |
| 2nd Author's Name | Yoji Bando |
| 2nd Author's Affiliation | Kobe University (Kobe Univ.) |
| 3rd Author's Name | Toru Ohkawa |
| 3rd Author's Affiliation | MIRAI-Selete (MIRAI-Selete) |
| 4th Author's Name | Masaaki Souda |
| 4th Author's Affiliation | MIRAI-Selete (MIRAI-Selete) |
| 5th Author's Name | Toshiharu Takaramoto |
| 5th Author's Affiliation | MIRAI-Selete (MIRAI-Selete) |
| 6th Author's Name | Toshio Yamada |
| 6th Author's Affiliation | MIRAI-Selete (MIRAI-Selete) |
| 7th Author's Name | Shigetaka Kumashiro |
| 7th Author's Affiliation | MIRAI-Selete (MIRAI-Selete) |
| 8th Author's Name | Tohru Mogami |
| 8th Author's Affiliation | MIRAI-Selete (MIRAI-Selete) |
| 9th Author's Name | Makoto Nagata |
| 9th Author's Affiliation | Kobe University (Kobe Univ.) |
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| Speaker | Author-1 |
| Date Time | 2011-07-22 10:25:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | ICD2011-28 |
| Volume (vol) | vol.111 |
| Number (no) | no.151 |
| Page | pp.73-78 |
| #Pages | 6 |
| Date of Issue | 2011-07-14 (ICD) |
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