Paper Abstract and Keywords |
Presentation |
2011-11-28 13:25
Performance Evaluation of Soft-Error Tolerant Multiple Modular Processors Implemented with Redundant and Non-Redundant Flip-Flops Shogo Okada, Masaki Masuda (KIT), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (KIT) VLD2011-59 DC2011-35 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Soft-error rates are becoming larger due to process scaling. Various ways of prediction for soft-error
are being tried. In this paper, we measure power dissipation of two soft-error tolerant multiple-modular processors
implemented with redundant and non-redundant flip-flops in 180nm, respectively. Redundant flip-flops have about
3x power and area than non-redundant flip-flops. The processor with redundant flip-flops has only 1.28x power and
1.71x area than the processor with non-redundant flip-flops. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Power / Area / Multiple Modular Processor / Redundant FF / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 324, VLD2011-59, pp. 43-48, Nov. 2011. |
Paper # |
VLD2011-59 |
Date of Issue |
2011-11-21 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2011-59 DC2011-35 |
Conference Information |
Committee |
VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
Conference Date |
2011-11-28 - 2011-11-30 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
NewWelCity Miyazaki |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design Gaia 2010 -New Field of VLSI Design- |
Paper Information |
Registration To |
VLD |
Conference Code |
2011-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Performance Evaluation of Soft-Error Tolerant Multiple Modular Processors Implemented with Redundant and Non-Redundant Flip-Flops |
Sub Title (in English) |
|
Keyword(1) |
Power |
Keyword(2) |
Area |
Keyword(3) |
Multiple Modular Processor |
Keyword(4) |
Redundant FF |
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Keyword(8) |
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1st Author's Name |
Shogo Okada |
1st Author's Affiliation |
Kyoto Institute of Technology (KIT) |
2nd Author's Name |
Masaki Masuda |
2nd Author's Affiliation |
Kyoto Institute of Technology (KIT) |
3rd Author's Name |
Jun Yao |
3rd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
4th Author's Name |
Hajime Shimada |
4th Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
5th Author's Name |
Kazutoshi Kobayashi |
5th Author's Affiliation |
Kyoto Institute of Technology (KIT) |
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Speaker |
Author-1 |
Date Time |
2011-11-28 13:25:00 |
Presentation Time |
25 minutes |
Registration for |
VLD |
Paper # |
VLD2011-59, DC2011-35 |
Volume (vol) |
vol.111 |
Number (no) |
no.324(VLD), no.325(DC) |
Page |
pp.43-48 |
#Pages |
6 |
Date of Issue |
2011-11-21 (VLD, DC) |
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