Paper Abstract and Keywords |
Presentation |
2011-11-30 10:05
Capture power reduction in multi-cycle test structure Hisato Yamaguchi, Makoto Matsuzono, Kohei Miyase, Yasuo Sato, Seiji Kajihara (KIT) VLD2011-83 DC2011-59 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Power consumption during Built-In Self-Test(BIST) is far larger than that of normal operation. Therefore, it may lead to a malfunction due to excessive voltage droop or performance deterioration due to high heating. The authors have proposed a multi-cycle test method that generates more than two capture clock to e improve test efficiency. This paper proposes a novel technique that reduces the power consumption during capture mode without test coverage loss using the multi-cycle test method. |
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Reference Info. |
IEICE Tech. Rep., vol. 111, no. 325, DC2011-59, pp. 179-183, Nov. 2011. |
Paper # |
DC2011-59 |
Date of Issue |
2011-11-21 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2011-83 DC2011-59 |
Conference Information |
Committee |
VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
Conference Date |
2011-11-28 - 2011-11-30 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
NewWelCity Miyazaki |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design Gaia 2010 -New Field of VLSI Design- |
Paper Information |
Registration To |
DC |
Conference Code |
2011-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
Language |
Japanese |
Title (in Japanese) |
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Title (in English) |
Capture power reduction in multi-cycle test structure |
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1st Author's Name |
Hisato Yamaguchi |
1st Author's Affiliation |
Kyushu Institute of Technology (KIT) |
2nd Author's Name |
Makoto Matsuzono |
2nd Author's Affiliation |
Kyushu Institute of Technology (KIT) |
3rd Author's Name |
Kohei Miyase |
3rd Author's Affiliation |
Kyushu Institute of Technology (KIT) |
4th Author's Name |
Yasuo Sato |
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Kyushu Institute of Technology (KIT) |
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Seiji Kajihara |
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Kyushu Institute of Technology (KIT) |
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Speaker |
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Date Time |
2011-11-30 10:05:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
VLD2011-83, DC2011-59 |
Volume (vol) |
vol.111 |
Number (no) |
no.324(VLD), no.325(DC) |
Page |
pp.179-183 |
#Pages |
5 |
Date of Issue |
2011-11-21 (VLD, DC) |
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