IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2012-02-09 13:00
Fault Classification Based on Likelihood Profile Feature
Takuya Mikami, Masashi Ando, Jun Koyama, Seiji Hotta (TUAT), Hisae Shibuya, Shunji Maeda (HITACHI) PRMU2011-192 SP2011-107
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, we propose a feature called likelihood profile for classifying fault events of a precision machine. This feature is obtained by extending a conventional feature named likelihood histogram to time sequence
one. By experiments with a real-life dataset, it is verified that our feature outperforms conventional ones. Key words fault classification,sensor feature, likelihood profile
Keyword (in Japanese) (See Japanese page) 
(in English) fault classification / sensor feature / likelihood profile / / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 430, PRMU2011-192, pp. 37-40, Feb. 2012.
Paper # PRMU2011-192 
Date of Issue 2012-02-02 (PRMU, SP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PRMU2011-192 SP2011-107

Conference Information
Committee PRMU SP  
Conference Date 2012-02-09 - 2012-02-10 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To PRMU 
Conference Code 2012-02-PRMU-SP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fault Classification Based on Likelihood Profile Feature 
Sub Title (in English)  
Keyword(1) fault classification  
Keyword(2) sensor feature  
Keyword(3) likelihood profile  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takuya Mikami  
1st Author's Affiliation Tokyo University of Agriculture and Technology (TUAT)
2nd Author's Name Masashi Ando  
2nd Author's Affiliation Tokyo University of Agriculture and Technology (TUAT)
3rd Author's Name Jun Koyama  
3rd Author's Affiliation Tokyo University of Agriculture and Technology (TUAT)
4th Author's Name Seiji Hotta  
4th Author's Affiliation Tokyo University of Agriculture and Technology (TUAT)
5th Author's Name Hisae Shibuya  
5th Author's Affiliation Yokohama Research Laboratory, Hitachi, Ltd. (HITACHI)
6th Author's Name Shunji Maeda  
6th Author's Affiliation Yokohama Research Laboratory, Hitachi, Ltd. (HITACHI)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2012-02-09 13:00:00 
Presentation Time 30 minutes 
Registration for PRMU 
Paper # PRMU2011-192, SP2011-107 
Volume (vol) vol.111 
Number (no) no.430(PRMU), no.431(SP) 
Page pp.37-40 
#Pages
Date of Issue 2012-02-02 (PRMU, SP) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan