Paper Abstract and Keywords |
Presentation |
2012-02-13 16:20
Evaluation of a thermal and voltage estimation circuit for field test Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Kohei Miyase (Kyutech), Yukiya Miura (TMU) DC2011-86 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
High dependability is required for an embedded system VLSI. High functionality and high performance of VLSI, due to the miniaturization of the manufacturing process, increase a performance deterioration caused by various aging mechanisms of VLSI circuits. Therefore, it is important to avoid a system down due to a sudden failure of VLSI due to an aging. The increase of a circuit delay is known as a typical aging phenomenon of a VLSI. However, the delay measurement for detecting aging on field needs to take account of the influence of thermal and voltage fluctuations. In this paper, for achieving highly accurate delay measurements that eliminate the effects of environmental factors, we show the test-chip design and evaluations of the thermal and voltage monitors, which consist of dedicated Ring-Oscillators, and discuss the estimation accuracy of temperature and voltage. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Aging / Field test / thermal and Voltage monitor / Ring Oscillator / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 435, DC2011-86, pp. 61-66, Feb. 2012. |
Paper # |
DC2011-86 |
Date of Issue |
2012-02-06 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2011-86 |
Conference Information |
Committee |
DC |
Conference Date |
2012-02-13 - 2012-02-13 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
DC |
Conference Code |
2012-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Evaluation of a thermal and voltage estimation circuit for field test |
Sub Title (in English) |
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Keyword(1) |
Aging |
Keyword(2) |
Field test |
Keyword(3) |
thermal and Voltage monitor |
Keyword(4) |
Ring Oscillator |
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1st Author's Name |
Yousuke Miyake |
1st Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
2nd Author's Name |
Yasuo Sato |
2nd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
3rd Author's Name |
Seiji Kajihara |
3rd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
4th Author's Name |
Kohei Miyase |
4th Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
5th Author's Name |
Yukiya Miura |
5th Author's Affiliation |
Tokyo Metropolitan University (TMU) |
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Speaker |
Author-1 |
Date Time |
2012-02-13 16:20:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2011-86 |
Volume (vol) |
vol.111 |
Number (no) |
no.435 |
Page |
pp.61-66 |
#Pages |
6 |
Date of Issue |
2012-02-06 (DC) |
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